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參數(shù)資料
| 型號： | HCTS283KMSR |
| 廠商： | HARRIS SEMICONDUCTOR |
| 元件分類： | 通用總線功能 |
| 英文描述： | Radiation Hardened 4 Bit Binary Full Adder with Fast Carry |
| 中文描述： | HCT SERIES, 4-BIT ADDER/SUBTRACTOR, CDFP16 |
| 文件頁數(shù)： | 6/9頁 |
| 文件大?。?/td> | 296K |
| 代理商： | HCTS283KMSR |
6
Specifications HCTS283MS
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test
I
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test
II
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Interim Test
III
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11,
(Note 2)
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTES:
1. Alternate Group A, in accordance with Method 5005 of MIL-STD-883, may be exercised.
2. Table 5 parameters only.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
TEST
READ AND RECORD
PRE RAD
POST RAD
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4 (Note 1)
NOTE: 1. Except FN Test which will be performed 100% Go/No-Go.
TABLE 8. STATIC BURN-IN AND DYNAMIC
OPEN
GROUND
1/2 VCC = 3V
±
0.5V
VCC = 6V
±
0.5V
OSCILLATOR
50kHz
25kHz
STATIC BURN-IN I TEST CONNECTIONS (Note 1)
1, 4, 9, 10, 13
2, 3, 5, 6, 7, 8, 11,
12, 14, 15
-
16
-
-
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
1, 4, 9, 10, 13
8
-
2, 3, 5, 6, 7, 11, 12,
14, 15, 16
-
-
DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)
-
8
1, 4, 9, 10, 13
16
2, 6, 7, 11, 15
3, 5, 12, 14
NOTES:
1. Each pin except VCC and GND will have a resistor of 10k
±
5% for static burn-in
2. Each pin except VCC and GND will have a resistor of 1K
±
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V
±
0.5V
1, 4, 9, 10, 13
8
2, 3, 5, 6, 7, 11, 12, 14, 15, 16
NOTE: Each pin except VCC and GND will have a resistor of 47K
±
5% for irradiation testing.
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number
518641
相關(guān)PDF資料 |
PDF描述 |
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| HCTS283DMSR | Radiation Hardened 4 Bit Binary Full Adder with Fast Carry |
| HCTS283MS | Radiation Hardened 4 Bit Binary Full Adder with Fast Carry |
| HCTS283HMSR | Radiation Hardened 4 Bit Binary Full Adder with Fast Carry |
| HCTS299DMSR | Radiation Hardened 8-Bit Universal Shift Register; Three-State |
| HCTS299HMSR | Radiation Hardened 8-Bit Universal Shift Register; Three-State |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| HCTS283MS | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened 4 Bit Binary Full Adder with Fast Carry |
| HCTS299D | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened 8-Bit Universal Shift Register; Three-State |
| HCTS299DMSR | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened 8-Bit Universal Shift Register; Three-State |
| HCTS299HMSR | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened 8-Bit Universal Shift Register; Three-State |
| HCTS299K | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened 8-Bit Universal Shift Register; Three-State |
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