參數(shù)資料
型號: HCTS4002K
廠商: Intersil Corporation
英文描述: Quadruple 2-Input Positive-NAND Gates 20-LCCC -55 to 125
中文描述: 輻射加固雙路4輸入或非門
文件頁數(shù): 5/9頁
文件大小: 125K
代理商: HCTS4002K
722
Specifications HCTS4002MS
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
OPEN
GROUND
1/2 VCC = 3V
±
0.5V
VCC = 6V
±
0.5V
OSCILLATOR
50kHz
25kHz
STATIC BURN-IN I TEST CONNECTIONS (Note 1)
1, 6, 8, 13
2 - 5, 7, 9 - 12
-
14
-
-
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
1, 6, 8, 13
7
-
2 - 5, 9 - 12, 14
-
-
DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)
6, 8
7
1, 13
14
2 - 5, 9 - 12
-
NOTES:
1. Each pin except VCC and GND will have a resistor of 10k
±
5% for static burn-in
2. Each pin except VCC and GND will have a resistor of 1K
±
5% for dynamic burn-in
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V
±
0.5V
1, 6, 8, 13
7
2 - 5, 9 - 12, 14
NOTE: Each pin except VCC and GND will have a resistor of 47K
±
5% for irradiation testing.
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number
518632
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