4
FIGURE 2A. LEAKAGE CURRENT vs TEMPERATURE
FIGURE 2B. ID(OFF) TEST CIRCUIT (NOTE 8)
FIGURE 2C. IS(OFF) TEST CIRCUIT (NOTE 8)
FIGURE 2D. ID(ON) TEST CIRCUIT (NOTE 8)
FIGURE 2. LEAKAGE CURRENTS
FIGURE 3A. TEST CIRCUIT
FIGURE 3B. MEASUREMENT POINTS
FIGURE 3. SETTLING TIME, ACCESS TIME, BREAK-BEFORE-MAKE DELAY (NOTE 9)
NOTES:
8. Two measurements per channel:
±10V and 10V. (Two measurements per device for ID(OFF) ±10V and 10V.)
9. The Break-Before-Make test requires inputs 1 and 4 at the same voltage.
10. Capacitor value may be selected to optimize AC performance.
Test Circuits and Waveforms TA = 25oC, VSUPPLY = ±15V, VAH = 2.4V, VAL = 0.8V, Unless Otherwise Specified
ID(ON)
0
25
50
75
100
125
150
TEMPERATURE (oC)
1.0
0.1
L
E
AKAG
E
CURRENT
(n
A)
IS(OFF)
ID(OFF)
OUT
ID(OFF)
A
10V
±
±10V
0.8V
EN
OUT
IS(OFF)
10V
±
±10V
0.8V
EN
A
OUT
ID(ON)
A
10V
±
±10V
+2.4V
EN
A1
A0
+
-
HA-2541
3V
2
18
16
20pF
OUTPUT
HA-524
5V
EN
A1
A0
±
±3V
75
(NOTE 10)
IN1
IN2
IN3
IN4
VA
50
ADDRESS DRIVE (VA)
1.6V
+3V
10%
-3V
VAL = 0.8V
VAH = 2.4V
ACCESS TIME, tA
SETTLING TIME, tS
HA-2541
OUTPUT
± 0.1% OF FULL SCALE
(OR
±0.01%)
HI-524