5
FIGURE 2A. LEAKAGE CURRENT vs TEMPERATURE
FIGURE 2B. ID(OFF) TEST CIRCUIT (NOTE 6)
FIGURE 2C. IS(OFF) TEST CIRCUIT (NOTE 6)
FIGURE 2D. ID(ON) TEST CIRCUIT (NOTE 6)
NOTE:
6. Three measurements =
±10V,
10V, and 0V.
FIGURE 2. LEAKAGE CURRENT
FIGURE 3A. SUPPLY CURRENT vs TOGGLE FREQUENCY
FIGURE 3B. TEST CIRCUIT
FIGURE 3. DYNAMIC SUPPLY CURRENT
Test Circuits and Waveforms Unless Otherwise Specified TA = 25oC, V+ = +15V, V- = -15V, VAH = 4V and VAL = 0.8V (Continued)
LE
A
KAGE
C
URRE
N
T
(nA)
10
1
25
TEMPERATURE (oC)
50
75
100
125
ID(ON)
ID(OFF) = IS(OFF)
A
10V
±
±10V
0.8V
EN
A0
A1
Similar Connection For Side “B”
HI-539
OUT A
ID(OFF)
0.8V
EN
A
Similar Connection For Side “B”
HI-539
A0
A1
10V
±
±10V
IS(OFF)
OUT A
ID(ON)
A
10V
±
±10V
4V
EN
A0
A1
HI-539
Similar Connection For Side “B”
±
14
12
10
8
6
4
2
0
100Hz
TOGGLE FREQUENCY
I+
S
U
P
LY
CURR
E
N
T
(mA)
VSUPPLY = ±15V
VSUPPLY = ±10V
FUNCTIONAL LIMIT
1kHz
10kHz
100kHz
1MHz 3MHz 10MHz
+10V/+5V
+15V/+10V
V+
V-
IN 1A
IN 2A
IN 4A
OUT A
EN
10M
14pF
A1
A0
50
VA
5V
GND
A
-15V/-10V
A
-ISUPPLY
+ISUPPLY
±-10V/-5V
VA
HIGH = 4.0V
LOW = 0V
50% DUTY CYCLE
IN 3A
HI-539
Similar Connection For Side “B”
HI-539