參數(shù)資料
型號: HI1176JCQ
廠商: INTERSIL CORP
元件分類: ADC
英文描述: Small glass bead with axial leads
中文描述: 1-CH 8-BIT FLASH METHOD ADC, PARALLEL ACCESS, PQFP32
封裝: 7 X 7 MM, ROHS COMPLIANT, MQFP-32
文件頁數(shù): 11/11頁
文件大?。?/td> 85K
代理商: HI1176JCQ
4-11
Test Circuits
FIGURE 8. INTEGRAL AND DIFFERENTIAL NON-LINEARITY ERROR AND OFFSET VOLTAGE TEST CIRCUIT
FIGURE 9. MAXIMUM OPERATIONAL SPEED AND DIFFERENTIAL GAIN AND PHASE ERROR TEST CIRCUIT
FIGURE 10. DIGITAL OUTPUT CURRENT TEST CIRCUIT
-
+
V
IN
HI1176
DUT
8
CLK (20MHz)
A<B
COMPARATOR
A>B
A8
A1
A0
B8
B1
B0
“0”
“1”
8
S1
S2
-V
+V
S1 : ON IF A < B
S2 : ON IF A > B
BUFFER
DVM
CONTROLLER
8
TO
111 10
000 00
SIGNAL
SOURCE
NTSC
SG
(CW)
V
IN
8
8
SCOPE
VECTOR
620
DG
DP
ERROR RATE
SG
AMP
HI1176
DUT
ECL
TTL
D/A
10-BIT
-5.2V
CLK
1
2
1
2
HPF
COUNTER
620
-5.2V
ECL
TTL
f
C
-40
0
100
IRE
SYNC
BURST
0.6V
2.6V
40 IRE
MODULATION
0.6V
2.6V
f
C
-1kHz
HI20201
V
RT
V
IN
V
RB
CLK
OE
GND
V
DD
0.6V
2.6V
V
OL
I
OL
+
-
V
RT
V
IN
V
RB
CLK
OE
GND
V
DD
0.6V
2.6V
V
OH
I
OH
+
-
HI1176
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