參數(shù)資料
型號: HI1396AIL
廠商: HARRIS SEMICONDUCTOR
元件分類: ADC
英文描述: 8-Bit, 125 MSPS, Flash A/D Converter
中文描述: 1-CH 8-BIT FLASH METHOD ADC, PARALLEL ACCESS, CQCC68
文件頁數(shù): 9/10頁
文件大?。?/td> 86K
代理商: HI1396AIL
4-1164
FIGURE 5A.
FIGURE 5B.
FIGURE 5. ANALOG INPUT BIAS AND POWER SUPPLY CURRENT TEST CIRCUITS
Aperture jitter is defined as follows:
σ
t
Where
σ
(unit: LSB) is the deviation of the output codes when the
input frequency is exactly the same as the clock and is sampled at
the largest slew rate point.
FIGURE 6A.
FIGURE 6B. APERTURE JITTER TEST METHOD
FIGURE 6. SAMPLING DELAY AND APERTURE JITTER TEST CIRCUIT
Test Circuits
(Continued)
13
1
2
3
4
5
6
7
8
9
10
11
12
14
15
16
17
18
19
20
30
42
41
40
39
38
37
36
35
34
33
32
31
29
28
27
26
25
24
21
22
23
A
-1V
I
IN
-2V
A I
EE
-5.2V
HI1396JCJ
60 59 58 57 56 55 54 53 52 51 50 49 48 47 46 45 44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25
61
62
63
64
65
66
67
68
1
2
3
4
5
6
7
8
9
A I
EE
-5.2V
-2V
A
I
IN
-1V
HI1396AIL
V
IN
HI1396
8
CLK
LOGIC
ANALYZER
1024
SAMPLES
ECL
BUFFER
AMP
OSC1
φ
: VARIABLE
OSC2
67.5MHz
67.5MHz
f
R
APERTURE JITTER
σ
(LSB)
129
128
127
126
125
0V
-1V
-2V
V
IN
CLK
V
IN
CLK
υ
t
t
t
AJ
------
σ
---------
2
π
f
×
=
=
HI1396
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