- 您現(xiàn)在的位置：買賣IC網 > PDF目錄370677 > HS9-1840ARH (Intersil Corporation) Radiation Hardened 16 Channel CMOS Analog Multiplexer with High-Z Analog Input Protection PDF資料下載
參數(shù)資料
| 型號： | HS9-1840ARH |
| 廠商： | Intersil Corporation |
| 英文描述： | Radiation Hardened 16 Channel CMOS Analog Multiplexer with High-Z Analog Input Protection |
| 中文描述： | 輻射硬化的高16通道CMOS模擬多路復用器，模擬輸入保護尬 |
| 文件頁數(shù)： | 10/13頁 |
| 文件大?。?/td> | 193K |
| 代理商： | HS9-1840ARH |
10
HS-1840RH
Harris - Space Level Product Flow
SEM - Traceable to Diffusion Method 2018, Modified
This device does not meet MIL-STD-883 Method 2018.3 Class
S minimum metal step coverage of 50%. The metal does meet
the intent of the Class S requirement by meeting the current
density requirement of <2E5 A/cm
2
. Calculation based on con-
tinuous current of 10mA. Data can be provided upon request.
Wafer Lot Acceptance Method 5007
Internal Visual Inspection (Note 1)
Gamma Radiation Assurance Tests Method 1019
100% Nondestructive Bond Pull Method 2023
Customer Pre-Cap Visual Inspection (Notes 1, 2)
Temperature Cycling Method 1010 Condition C
Constant Acceleration Method 2001 Y1 30KG
Particle Impact Noise Detection Method 2020,
Condition A 20G
Marking and Serialization
X-Ray Inspection Method 2012
Initial Electrical Tests (T0)
Static Burn-In 72 Hour, +125
o
C (Min) Method 1015
Condition A
Room Temperature Electrical Tests (T1)
Burn-In Delta Calculation (T0-T1)
PDA Calculation 3% Functional
5% Subgroups 1, 7,
Dynamic Burn-In 240 Hours at +125
o
C or equivalent
Method 1015 Condition A
Electrical Tests Subgroups 1, 7, 9 (T2)
Burn-In Delta Calculation (T0 - T2)
PDA Calculation 3% Functional
5% Subgroups 1, 7,
Electrical Test +125
o
C, -55
o
C
Alternate Group A Inspection Method 5005
Fine and Gross Leak Tests Method 1014
Customer Source Inspection (Note 2)
Group B Inspection (Notes 2, 4) Method 5005
Group D Inspection (Notes 2, 4) Method 5005
External Visual Inspection Method 2009
Data Package Generation (Note 3)
NOTES:
1. Visual Inspection is performed to MIL-STD-883 Method 2010, Condition A.
2. These steps are optional, and should be listed on the purchase order if required.
3. Data package contains: Assembly Attributes (post seal)
Test Attributes (includes Group A) -55
o
C, +25
o
C, +125
o
C
Shippable Serial Number List
Radiation Testing Certificate of Conformance
Wafer Lot Acceptance Report (includes SEM report)
X-Ray Report and Film
Test Variables Data, (Table 5 Parameters only)
+25
o
C Initial Test
+25
o
C Interim Test 1
+25
o
C Interim Test 2
+25
o
C Delta Over Burn-In
4. Group B data package contains Attributes Data and Variables Data, (Table 5 Parameters only). Group D data package contains Attributes only.
Harris -8 Product Flow
Internal Visual Inspection, Alternate Condition B (Note 1)
Gamma Radiation Assurance Tests Method 1019
Customer Pre-Cap Visual Inspection (Notes 1, 2)
Temperature Cycling Method 1010 Condition C (50 Cycles)
Constant Acceleration Method 2001 Y1 30kG
Fine and Gross Leak Tests Method 1014
Marking
Initial Electrical Tests (T0)
Dynamic Burn-In 160 Hours, +125
o
C Method 1015 or
Equivalent Condition D
Electrical Tests Subgroups 1, 7, 9 (T1) Method 5004
PDA Calculation 5% Subgroups 1, 7 Method 5004
Electrical Test +125
o
C, -55
o
C Method 5004
Alternate Group A Inspection Method 5005
Customer Source Inspection (Note 2)
Group B Inspection (Notes 2, 4) Method 5005 (Optional)
Group C Inspection (Notes 2, 4) Method 5005 (Optional)
Group D Inspection (Notes 2, 4) Method 5005 (Optional)
External Visual Inspection Method 2009
Data Package Generation (Note 3)
NOTES:
1. Visual inspection is performed to MIL-STD-883 Method 2010, Alternate Condition B.
2. These steps are optional, and should be listed on the purchase order if required.
3. Data Package Contents:
Test Attributes (including Group A) -55
o
C, +25
o
C, +125
o
C
Radiation Testing Certificate of Conformance
4. Group B, C and D data package contains Attributes Data only.
Spec Number
518022
相關PDF資料 |
PDF描述 |
|---|---|
| HS9-1840ARH-T | Radiation Hardened 16 Channel CMOS Analog Multiplexer with High-Z Analog Input Protection |
| HS1-1840ARH-T | Radiation Hardened 16 Channel CMOS Analog Multiplexer with High-Z Analog Input Protection |
| HS-1840ARH | Rad-Hard 16 Channel CMOS Analog Multiplexer with High-Z Analog Input Protection |
| HS-1840ARH-T | Radiation Hardened 16 Channel CMOS Analog Multiplexer with High-Z Analog Input Protection |
| HS1-1840ARH-Q | ER 3C 3#12 PIN RECP |
相關代理商/技術參數(shù) |
參數(shù)描述 |
|---|---|
| HS9-1840ARH/PROTO | 制造商:Intersil Corporation 功能描述:ANLG MUX SGL 16:1 28PIN CFLATPACK - Bulk |
| HS9-1840ARH-8 | 制造商:Intersil Corporation 功能描述: 制造商:Intersil Corporation 功能描述:ANLG MUX SGL 16:1 28CFPAK - Bulk |
| HS9-1840ARH-Q | 制造商:Intersil Corporation 功能描述: 制造商:Intersil Corporation 功能描述:ANLG MUX SGL 16:1 28CFPAK - Bulk |
| HS9-1840ARH-T | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened 16 Channel CMOS Analog Multiplexer with High-Z Analog Input Protection |
| HS9-1840BRH | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Rad-Hard 16 Channel CMOS Analog Multiplexer with High-Z Analog Input Protection |
發(fā)布緊急采購，3分鐘左右您將得到回復。