參數(shù)資料
型號(hào): HSN-500
廠商: Maxwell Technologies, Inc
英文描述: Nuclear Event Detector
中文描述: 核事件探測(cè)器
文件頁數(shù): 3/4頁
文件大小: 161K
代理商: HSN-500
M
3
All data sheets are subject to change without notice
2005 Maxwell Technologies
All rights reserved.
Nuclear Event Detector
HSN-500
01.07.05 Rev 3
M
ECHANICAL
D
IMENSIONS
Note: All dimensions in inches.
1. Standby mode is the normal state of the device, defined as having the NED output (pin 2) in the “high” state.
2. Operational mode is in effect during the timeout period of the NED signal, characterized by having the NED output in the “l(fā)ow”
state, causing the greatest current draw of the device.
3. BIT electrical characteristics are not guaranteed over the radiation range.
4. BIT may not meet specification when only a resistor is used to adjust the detection level. To use BIT in this situation, it is
advised that a series resistor/capacitor combination is used.
5. Guaranteed but not tested over temperature. Time delay, t
D
, is measured at 50% points fromthe rising edge of the radiation
pulse to the falling edge of the NED output at approximately 10 times the detection level.
0.600
0.015 ± 0.003
0.100
TYP
0.500
MIN
0.495
0.795
0.145 MAX
0.070 ± 0.002
0.010 ± 0.002
14 13 12 11 10
9
8
1
2
3
4
5
6
7
14 13 12 11 10
9
8
1
2
3
4
5
6
7
0.795
0.600
0.100 TYP
0.495
0.300
0.145 MAX
0.200
0.016
TOP VIEW
Flatpack Hybrid Package
HSN-500F
DIP Hybrid Package
HSN-500L
All tolerances are ± 0.005 unless specified
Table 2. Notes
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