參數(shù)資料
型號: HY29LV160BF-90I
廠商: HYNIX SEMICONDUCTOR INC
元件分類: DRAM
英文描述: ECONOLINE: RKZ - Safety standards and approvals: EN 60950 certified, rated for 250VAC (LVD test report)- Custom Solutions Available- 3kVDC & 4kVDC Isolation- UL94V-0 Package Material- Power Sharing on Output- Efficiency to 84%
中文描述: 1M X 16 FLASH 2.7V PROM, 90 ns, PBGA48
封裝: 8 X 9 MM, FBGA-48
文件頁數(shù): 38/48頁
文件大?。?/td> 517K
代理商: HY29LV160BF-90I
38
Rev. 1.2/May 01
HY29LV160
AC CHARACTERISTICS
0x555 for Program
0x2AA for Erase
PA for Program
SA for Sector Erase
0x555 for Chip Erase
t
WS
t
RH
t
WH
CE#
OE#
Addresses
t
WC
VA
t
AS
t
AH
WE#
Data
RY/BY#
t
DS
Status
D
OUT
t
BUSY
t
WHWH1
or t
WHWH2
or t
WHWH3
t
DH
0xA0 for Program
0x55 for Erase
PD for Program
0x30 for Sector Erase
0x10 for Chip Erase
RESET#
t
CP
t
CPH
t
GHEL
Notes:
1.
PA = program address, PD = program data, VA = Valid Address for reading program or erase status (see Write
Operation Status section), D
OUT
= array data read at VA.
Illustration shows the last two cycles of the program or erase command sequence and the last status read cycle.
Word mode addressing shown.
RESET# shown only to illustrate t
RH
measurement references. It cannot occur as shown during a valid command
sequence.
2.
3.
4.
Figure 26. Alternate CE# Controlled Write Operation Timings
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