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參數(shù)資料
| 型號： | IDT54FCT299CTEB |
| 廠商： | INTEGRATED DEVICE TECHNOLOGY INC |
| 元件分類： | 通用總線功能 |
| 英文描述： | FAST CMOS 8-INPUT UNIVERSAL SHIFT REGISTER |
| 中文描述： | FCT SERIES, 8-BIT BIDIRECTIONAL PARALLEL IN PARALLEL OUT SHIFT REGISTER, TRUE OUTPUT, CDFP20 |
| 封裝： | CERPACK-20 |
| 文件頁數(shù)： | 3/7頁 |
| 文件大?。?/td> | 109K |
| 代理商： | IDT54FCT299CTEB |
IDT54/74FCT299T/AT/CT
FAST CMOS 8-INPUT UNIVERSAL SHIFT REGISTER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
6.11
3
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Commercial: T
A
= 0
°
C to +70
°
C, V
CC
= 5.0V
±
5%; Military: T
A
= –55
°
C to +125
°
C, V
CC
= 5.0V
±
10%
Symbol
Parameter
V
IH
Input HIGH Level
Guaranteed Logic HIGH Level
V
IL
Input LOW Level
Guaranteed Logic LOW Level
I
IH
Input HIGH Current
(4)
V
CC
= Max., V
I
= 2.7V
I
IL
Input LOW Current
(4)
V
CC
= Max., V
I
= 0.5V
I
I
Input HIGH Current
(4)
V
CC
= Max., V
I
= Vcc (Max.)
V
IK
Clamp Diode Voltage
V
CC
= Min., I
N
= –18mA
I
OS
Short Circuit Current
V
CC
= Max.,
(3)
V
O
= GND
V
OH
Output HIGH Voltage
V
CC
= Min.
V
IN
= V
IH
or V
IL
Test Conditions
(1)
Min.
2.0
—
—
—
—
—
–60
2.4
Typ.
(2)
—
—
—
—
—
–0.7
–120
3.3
Max.
—
0.8
±
1
±
1
±
1
–1.2
–225
—
Unit
V
V
μ
A
μ
A
μ
A
V
mA
V
I
OH
= –6mA MIL.
I
OH
= –8mA COM'L.
I
OH
= –12mA MIL.
I
OH
= –15mA COM'L.
I
OL
= 32mA MIL.
I
OL
= 48mA COM'L.
2.0
3.0
—
V
V
OL
Output LOW Voltage
V
CC
= Min.
V
IN
= V
IH
or V
IL
V
CC
= 0V, V
IN
or V
O
≤
4.5V
—
0.3
0.5
V
I
OFF
Input/Output Power Off
Leakage
(5)
Input Hysteresis
Quiescent Power
Supply Current
—
—
±
1
μ
A
V
H
I
CC
—
—
—
200
0.01
—
1
mV
mA
V
CC
= Max.
V
IN
= GND or V
CC
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25
°
C ambient.
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. The test limit for this parameter is
±
5
μ
A at T
A
= -55
°
C.
5. This parameter is guaranteed but not tested.
2632 tbl 05
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