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| 型號： | IDT54FCT521ATSO |
| 廠商： | Integrated Device Technology, Inc. |
| 英文描述： | FAST CMOS 8-BIT IDENTITY COMPARATOR |
| 中文描述： | 快速CMOS 8位身分比較器 |
| 文件頁數(shù)： | 2/5頁 |
| 文件大?。?/td> | 100K |
| 代理商： | IDT54FCT521ATSO |
MILITARY AND COMMERCIAL TEMPERATURE RANGES
IDT54/74FCT521T/AT/BT/CT
FAST CMOS 8-BIT IDENTITY COMPARATOR
6.16
2
PIN DESCRIPTION
Pin Names
2572 tbl 01
FUNCTION TABLE
(1)
NOTE:
1. H = HIGH Voltage Level
L = LOW Voltage Level
*
A
0 =
B
0,
A
1 =
B
1,
A
2 =
B
2, etc.
CAPACITANCE
(T
A
= +25
°
C, f = 1.0MHz)
Symbol
Parameter
(1)
C
IN
Input
Capacitance
C
OUT
Output
Capacitance
NOTE:
1. This parameter is measured at characterization but not tested.
2572 tbl 02
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
Rating
V
TERM(2)
Terminal Voltage
with Respect to
GND
V
TERM(3)
Terminal Voltage
with Respect to
GND
T
A
Operating
Temperature
T
BIAS
Temperature
Under Bias
T
STG
Storage
Temperature
P
T
Power Dissipation
Commercial
–0.5 to +7.0
Military
–0.5 to +7.0
Unit
V
–0.5 to
V
CC
+0.5
–0.5 to
V
CC
+0.5
V
0 to +70
–55 to +125
°
C
–55 to +125
–65 to +135
°
C
–55 to +125
–65 to +150
°
C
0.5
0.5
W
I
OUT
DC Output
Current
–60 to +120 –60 to +120 mA
2572 lnk 03
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RAT-
INGS may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification is
not
implied. Exposure to absolute maximum rating conditions for
extended periods may affect reliability. No terminal voltage may exceed
V
CC
by +0.5V unless otherwise noted.
2. Input and V
CC
terminals only.
3. Outputs and I/O terminals only.
Conditions
V
IN
= 0V
Typ.
6
Max. Unit
10
pF
V
OUT
= 0V
8
12
pF
2572 lnk 04
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Commercial: T
A
= 0
°
C to +70
°
C, V
CC
= 5.0V
±
5%; Military: T
A
= –55
°
C to +125
°
C, V
CC
= 5.0V
±
10%
Symbol
Parameter
V
IH
Input HIGH Level
Guaranteed Logic HIGH Level
V
IL
Input LOW Level
Guaranteed Logic LOW Level
I
I H
Input HIGH Current
(4)
V
CC
= Max.
Input LOW Current
(4)
V
CC
= Max.
I
I
Input HIGH Current
(4)
V
CC
= Max., V
I
= V
CC
(Max.)
V
IK
Clamp Diode Voltage
V
CC
= Min., I
N
= –18mA
I
OS
Short Circuit Current
V
CC
= Max.
(3)
, V
O
= GND
Test Conditions
(1)
Min.
2.0
—
—
Typ.
(2)
—
—
—
Max.
—
0.8
±
1
±
1
±
1
–1.2
–225
Unit
V
V
μ
A
μ
A
μ
A
V
mA
V
I
= 2.7V
I
I L
V
I
= 0.5V
—
—
—
–60
—
—
–0.7
–120
V
OH
Output HIGH Voltage
V
CC
= Min.
V
IN
= V
IH
or V
IL
I
OH
= –6mA MIL.
I
OH
= –8mA COM'L.
I
OH
= –12mA MIL.
I
OH
= –15mA COM'L.
I
OL
= 32mA MIL.
I
OL
= 48mA COM'L.
2.4
3.3
—
V
2.0
3.0
—
V
V
OL
Output LOW Voltage
V
CC
= Min.
V
IN
= V
IH
or V
IL
—
0.3
0.5
V
V
H
I
CC
Input Hysteresis
Quiescent Power Supply Current
—
—
—
200
0.01
—
1
mV
mA
V
CC
= Max.
V
IN
= GND or V
CC
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25
°
C ambient.
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. The test limit for this parameter is
±
5
μ
A at T
A
= -55
°
C.
2572 tbl 05
Description
A
0
- A
7
B
0
- B
7
I
A
=
B
O
A
=
B
Word A Inputs
Word B Inputs
Expansion or Enable Input (Active LOW)
Identity Output (Active LOW)
Inputs
Output
O
A=B
I
A=B
A, B
A = B*
A
≠
B
A = B*
A
≠
B
L
L
H
H
L
H
H
H
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