參數(shù)資料
型號(hào): IDT54FCT646CL
廠商: Integrated Device Technology, Inc.
英文描述: CAP 0.22UF 50V 20% X7R SMD-1210 TR-7-PL SN-NIBAR
中文描述: 快速CMOS八端口收發(fā)器/注冊(cè)
文件頁數(shù): 4/8頁
文件大?。?/td> 91K
代理商: IDT54FCT646CL
7.18
4
IDT54/74FCT646/A/C
FAST CMOS OCTAL TRANSCEIVER/REGISTER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
Rating
V
TERM(2)
Terminal Voltage
with Respect
to GND
V
TERM(3)
Terminal Voltage
with Respect
to GND
T
A
Operating
Temperature
T
BIAS
Temperature
Under Bias
T
STG
Storage
Temperature
P
T
Power Dissipation
I
OUT
DC Output Current
Commercial
–0.5 to +7.0
Military
–0.5 to +7.0
Unit
V
–0.5 to V
CC
–0.5 to V
CC
V
0 to +70
–55 to +125
°
C
–55 to +125
–65 to +135
°
C
–55 to +125
–65 to +150
°
C
0.5
120
0.5
120
W
mA
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM
RATINGS may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or any other
conditions above those indicated in the operational sections of this
specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability. No terminal voltage
may exceed V
CC
by +0.5V unless otherwise noted.
2. Inputs and V
CC
terminals only.
3. Outputs and I/O terminals only.
2536 tbl 03
CAPACITANCE
(T
A
= +25
°
C, f = 1.0MHz)
Symbol
Parameter
(1)
C
IN
Input Capacitance
C
I/O
I/O Capacitance
Conditions
V
IN
= 0V
V
OUT
= 0V
Typ. Max.
6
8
Unit
pF
pF
10
12
NOTE:
1. This parameter is measured at characterization but not tested.
2536 tbl 04
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified: V
LC
= 0.2V; V
HC
= V
CC
– 0.2V
Commercial: T
A
= 0
°
C to +70
°
C, V
CC
= 5.0V
±
5%; Military: T
A
= –55
°
C to +125
°
C, V
CC
= 5.0V
±
10%
Symbol
Parameter
V
IH
Input HIGH Level
Guaranteed Logic HIGH Level
V
IL
Input LOW Level
Guaranteed Logic LOW Level
I
IH
Input HIGH Current
V
CC
= Max.
(Except I/O pins)
I
IL
Input LOW Current
(Except I/O pins)
I
IH
Input HIGH Current
V
CC
= Max.
(I/O pins only)
I
IL
Input LOW Current
(I/O pins only)
V
IK
Clamp Diode Voltage
V
CC
= Min., I
N
= –18mA
I
OS
Short Circuit Current
V
CC
= Max.
(3)
, V
O
= GND
V
OH
Output HIGH Voltage
V
CC
= 3V, V
IN
= V
LC
or V
HC
, I
OH
= –32
μ
A
V
CC
= Min.
V
IN
= V
IH
or V
IL
Test Conditions
(1)
Min.
2.0
–60
V
HC
V
HC
2.4
2.4
Typ.
(2)
–0.7
–120
V
CC
V
CC
4.0
4.0
GND
GND
0.3
0.3
Max.
0.8
5
5
(4)
–5
(4)
–5
15
15
(4)
–15
(4)
–15
–1.2
V
LC
V
LC(4)
0.55
0.55
Unit
V
V
μ
A
V
I
= V
CC
V
I
= 2.7V
V
I
= 0.5V
V
I
= GND
V
I
= V
CC
V
I
= 2.7V
V
I
= 0.5V
V
I
= GND
μ
A
V
mA
V
I
OH
= –300
μ
A
I
OH
= –12mA MIL.
I
OH
= –15mA COM’L.
V
OL
Output LOW Voltage
V
CC
= 3V, V
IN
= V
LC
or V
HC
, I
OL
= 300
μ
A
V
CC
= Min.
V
IN
= V
IH
or V
IL
V
I
OL
= 300
μ
A
I
OL
= 48mA MIL.
I
OL
= 64mA COM’L.
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25
°
C ambient and maximum loading.
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. This parameter is guaranteed but not tested.
2536 tbl 05
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