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參數(shù)資料
| 型號(hào)： | IDT74FCT16H244ATPFB |
| 廠商： | Integrated Device Technology, Inc. |
| 元件分類： | 通用總線功能 |
| 英文描述： | FAST CMOS 16-BIT BUFFER/LINE DRIVER |
| 中文描述： | 快速CMOS 16位緩沖/線路驅(qū)動(dòng)器 |
| 文件頁(yè)數(shù)： | 3/9頁(yè) |
| 文件大?。?/td> | 151K |
| 代理商： | IDT74FCT16H244ATPFB |
5.2
3
IDT54/74FCT16244T/AT/CT/ET, 162244T/AT/CT/ET,
166244T/AT/CT, 162H244T/AT/CT/ET FAST CMOS 16-BIT BUFFER/LINE DRIVER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
NOTE:
1. This parameter is measured at characterization but not tested.
CAPACITANCE
(T
A
= +25
°
C, f = 1.0MHz)
FUNCTION TABLE
(1)
2544 lnk 04
NOTE:
1. H = HIGH Voltage Level
X = Don’t Care
L = LOW Voltage Level
Z = High Impedance
2544 tbl 02
Symbol
C
IN
Parameter
(1)
Input
Capacitance
Output
Capacitance
Conditions
V
IN
= 0V
Typ.
3.5
Max.
6.0
Unit
pF
C
OUT
V
OUT
= 0V
3.5
8.0
pF
ABSOLUTE MAXIMUM RATINGS
(1)
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE (STANDARD PARTS)
Following Conditions Apply Unless Otherwise Specified:
Commercial: T
A
= –40
°
C to +85
°
C, V
CC
= 5.0V
±
10%; Military: T
A
= –55
°
C to +125
°
C, V
CC
= 5.0V
±
10%
Inputs
Outputs
xYx
L
x
OE
L
xAx
L
L
H
H
X
H
Z
Symbol
V
IH
Parameter
Test Conditions
(1)
Min.
2.0
Typ.
(2)
—
Max.
—
Unit
V
Input HIGH Level
Guaranteed Logic HIGH Level
V
IL
I
I H
Input LOW Level
Input HIGH Current (Input pins)
(5)
Input HIGH Current (I/O pins)
(5)
Input LOW Current (Input pins)
(5)
Input LOW Current (I/O pins)
(5)
High Impedance Output Current
(3-State Output pins)
(5)
Guaranteed Logic LOW Level
V
CC
= Max.
—
—
—
—
—
0.8
±
1
±
1
±
1
±
1
±
1
±
1
–
1.2
V
μ
A
V
I
= V
CC
—
—
I
I L
V
I
= GND
—
—
—
—
—
I
OZH
I
OZL
V
CC
= Max.
V
O
= 2.7V
V
O
= 0.5V
—
μ
A
—
V
IK
I
OS
V
H
Clamp Diode Voltage
Short Circuit Current
Input Hysteresis
V
CC
= Min., I
IN
= –18mA
V
CC
= Max., V
O
= GND
(3)
—
–80
—
–
0.7
V
–
140
100
–
225
mA
mV
μ
A
—
—
I
CCL
I
CCH
I
CCZ
Quiescent Power Supply Current
V
CC
= Max., V
IN
= GND or V
CC
—
5
500
2544 lnk 05
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 5.0V, +25
°
C ambient.
3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
4. Duration of the condition can not exceed one second.
5. The test limit for this parameter is
±
5
μ
A at T
A
= –55
°
C.
Symbol
V
TERM(2)
Terminal Voltage with Respect to
GND
V
TERM(3)
Terminal Voltage with Respect to
GND
Description
Max.
Unit
V
–0.5 to +7.0
–0.5 to
V
CC
+0.5
–65 to +150
–60 to +120 mA
V
T
STG
I
OUT
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS
may cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification is
not
implied. Exposure to absolute maximum rating conditions for
extended periods may affect reliability.
2. All device terminals except FCT162XXXT and FCT166XXXT output and
I/O terminals.
3. Output and I/O terminals for FCT162XXXT and FCT166XXXT.
Storage Temperature
DC Output Current
°
C
2544 lnk 03
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