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| 型號： | INTRO_TO_TRANSISTOR |
| 文件頁數(shù)： | 9/13頁 |
| 文件大?。?/td> | 404K |
| 代理商： | INTRO_TO_TRANSISTOR |
Material Purchasing
Incoming Inspection
Production Process
Physical and Chemical Inspection
Quality Control
Production Process Control
Specialized Tests for all units
Shipping Inspection
Shipment
Marking
Packing
Periodical Quality Assurance Test
1. Operational Life (continuous) Test
2. Operational Life (intermittent) Test
3. High Temperature Storage Test
4. Low Temperature Storage Test
5. Moisture Resistance Test
6. Heat Cycle Test
7. Heat Shock Test
8. Soldering Heat Test
9. Vibaration Test
10. Drop Test
7
Test
Continuous Operations Test
Intermittent Operation Test
High Temperature Storage Test
Low Temperature Storage Test
Moisture Resistance Test
Heat Cycle Test
Heat Shock Test
Soldering Heat Test
Vibrations Test
Drop Test
Details of the Testing Method
Collector dissipation with maximum junction temperature is applied continuously at
room temperature to judge lifespan and reliability under transistor operating conditions.
Power equal to that used in the Continuous Operations Test is applied intermittently
to test the transistor’s lifespan and reliability under on and off conditions.
Confirms the highest storage temperature and operating temperature of transistors.
Confirms the lowest storage temperature of transistors.
Tested at RH=85% and TA=85°C for the effects of the interaction between
temperature and humidity, and the effects of surface insulation between electrodes
and high temperature/high humidity.
Tested at Tstg min – Room temp. – Tstg max – Room temp. for 10 cycles (one cycle
30 min. –5 min. –30 min. –5 min.) to detect mechanical faults and characteristic
changes caused by thermal expansion and shrinkage of the transistor.
Tested at 100°C (5 min.), 25°C (within 3 sec.), 0°C (5 min.) for 10 cycles to check for
mechanical faults and characteristic changes caused by thermal expansion and
shrinkage of transistor.
Tested at 260±5°C, 10 ±1 sec, by dipping lead wire to 1.5mm from the seating plane
in solder bath to check for characteristic changes caused by drastic temperature rises
of exterior lead wire.
Tested at amplitude 1.52mm, vibration frequency 10-55 Hz in directions of X, Y, Z, for
2 hours each (total 6 hours) to check for characteristic changes caused by vibration
during operation and transportion.
Tested by dropping 10 times from 75 cm height to check for mechanical endurance
and characteristic changes caused by shock during handling.
Table 1: Test Methods and Conditions
LTPD(%)
*5/1000hrs
5/1000hrs
5/1000hrs
5/1000hrs
5/1000hrs
5
5
5
5
5
Figure 3 Quality Assurance System
Reliability Standard : 60%
Reliability
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| INTRUMENT | For EM60000 series |
| IO100VXI | |
| IO110VXI | |
| IO120VXI | |
| IO130VXI | |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| INTROVAC XS | 制造商:ABIKO 功能描述:Bulk |
| INTRUMENT | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:For EM60000 series |
| INT-SIGEL | 制造商:Pan Pacific 功能描述: |
| INT-SLVGEL | 制造商:Pan Pacific 功能描述: |
| INTTEST2S3P | 制造商:Panasonic Industrial Devices 功能描述: |
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