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10
FN6054.3
October 28, 2010
FIGURE 3A. tBBM MEASUREMENT POINTS
Repeat test for other switches. CL includes fixture and stray
capacitance.
FIGURE 3B. tBBM TEST CIRCUIT
FIGURE 3. BREAK-BEFORE-MAKE TIME
Logic input waveform is inverted for switches that have the opposite
logic sense.
FIGURE 4A. LATCH tS, tH, tMPW MEASUREMENT POINTS
Repeat test for other switches. CL includes fixture and stray
capacitance.
FIGURE 4B. LATCH tS, tH, tMPW TEST CIRCUIT
FIGURE 4. LATCH SETUP AND HOLD TIMES
FIGURE 5. OFF ISOLATION TEST CIRCUIT
FIGURE 6. RON TEST CIRCUIT
Test Circuits and Waveforms (Continued)
80%
3V
0V
tBBM
LOGIC
INPUT
SWITCH
OUTPUT
0V
VOUT
tr < 20ns
tf < 20ns
LOGIC
INPUT
ADDX
COMX
RL
CL
VOUT
35pF
300
Ω
NCX, NOX
GND
V+
C
EN
V-
C
V+
C
EN, LE
50%
tr < 20ns
tf < 20ns
tH
90%
3V
0V
LOGIC
INPUT
SWITCH
OUTPUT
VOUT
VNCX
LE
3V
0V
LOGIC
INPUT
ADDX
tH
tS
50%
tON, tOFF
0V
tMPW
VOUT
V(NO or NC)
RL
RL R ON
()
+
------------------------------
=
LOGIC
INPUT
VOUT
RL
COMX
NCX
LE
300
Ω
35pF
GND
CL
V+
EN
C
V-
C
V+
C
NOX
EN
LOGIC
INPUT
ADDX
ANALYZER
RL
SIGNAL
GENERATOR
0V or V+
NO or NC
COM
ADDX
GND
EN
0V or V+
V-
C
V+
C
EN, LE
0V or V+
NO or NC
COM
ADDX
GND
VNX
V1
RON = V1/1mA
1mA
EN
V-
C
V+
C
EN, LE
ISL43231