參數(shù)資料
型號: ISL54047IRUZ-T
廠商: Intersil
文件頁數(shù): 10/12頁
文件大?。?/td> 0K
描述: IC MUX/DEMUX 4X1 10UTQFN
標(biāo)準(zhǔn)包裝: 3,000
功能: 開關(guān)
電路: 2 x SPST - NO
導(dǎo)通狀態(tài)電阻: 450 毫歐
電壓電源: 單電源
電壓 - 電源,單路/雙路(±): 1.65 V ~ 4.5 V
電流 - 電源: 100nA
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 10-UFQFN
供應(yīng)商設(shè)備封裝: 10-UTQFN(1.8x1.40)
包裝: 帶卷 (TR)
7
FN6503.0
May 31, 2007
Detailed Description
The ISL54047 is a bidirectional, differential single pole/single
throw (SPST) analog switch that offer precise switching
capability from a single 1.65V to 4.5V supply with low
on-resistance (0.44
Ω) and high speed operation (t
ON =
40ns, tOFF = 35ns). The devices are especially well suited
for portable battery powered equipment due to their low
operating supply voltage (1.65V), low power consumption
(4.5
μW max) and the tiny μTQFN package. The ultra low on-
resistance and Ron flatness provide very low insertion loss
and distortion to applications that require signal reproduction.
External V+ Series Resistor
For improved ESD and latch-up immunity Intersil
recommends adding a 100
Ω resistor in series with the V+
power supply pin of the ISL54047 IC (see Figure 7).
During an over-voltage transient event, such as occurs
during system level IEC 61000 ESD testing, substrate
currents can be generated in the IC that can trigger parasitic
SCR structures to turn ON, creating a low impedance path
from the V+ power supply to ground. This will result in a
significant amount of current flow in the IC which can
potentially create a latch-up state or permanently damage
the IC. The external V+ resistor limits the current during this
over-stress situation and has been found to prevent latch-up
or destructive damage for many over voltage transient
events.
Under normal operation the sub-microamp IDD current of the
IC produces an insignificant voltage drop across the 100
Ω
series resistor resulting in no impact to switch operation or
performance.
Supply Sequencing and Overvoltage Protection
With any CMOS device, proper power supply sequencing is
required to protect the device from excessive input currents
which might permanently damage the IC. All I/O pins contain
ESD protection diodes from the pin to V+ and to GND (see
Figure 8). To prevent forward biasing these diodes, V+ must
be applied before any input signals, and the input signal
voltages must remain between V+ and GND.
If these conditions cannot be guaranteed, then precautions
must be implemented to prohibit the current and voltage at
the logic pin and signal pins from exceeding the maximum
ratings of the switch. The following two methods can be used
to provided additional protection to limit the current in the
event that the voltage at a signal pin or logic pin goes below
ground or above the V+ rail.
Logic inputs can be protected by adding a 1k
Ω resistor in
series with the logic input (see Figure 8). The resistor limits
FIGURE 5. CROSSTALK TEST CIRCUIT
FIGURE 6. CAPACITANCE TEST CIRCUIT
Test Circuits and Waveforms (Continued)
0V or V+
ANALYZER
V+
C
NO
SIGNAL
GENERATOR
RL
GND
IN1
COM
50
Ω
N.C.
COM
NO
Signal direction through switch is reversed, worst case values
are recorded. Repeat test for all switches.
V+
C
GND
NO
COM
IN
IMPEDANCE
ANALYZER
0V or V+
Repeat test for all switches.
FIGURE 7. V+ SERIES RESISTOR FOR ENHANCED ESD AND
LATCH-UP IMMUNITY
IN
COM1
100
Ω
NO1
N02
V+
GND
C
OPTIONAL
PROTECTION
RESISTOR
COM2
ISL54047
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