FN6051.7 February 27, 2006 Human Body Model Testing As the name implies, this test method emulates the ESD event delivered to an IC duri" />
參數(shù)資料
型號: ISL8487EIB-T
廠商: Intersil
文件頁數(shù): 2/14頁
文件大?。?/td> 0K
描述: IC TXRX RS485/422 5V ESD 8-SOIC
標(biāo)準(zhǔn)包裝: 2,500
類型: 收發(fā)器
驅(qū)動器/接收器數(shù): 1/1
規(guī)程: RS422,RS485
電源電壓: 4.5 V ~ 5.5 V
安裝類型: 表面貼裝
封裝/外殼: 8-SOIC(0.154",3.90mm 寬)
供應(yīng)商設(shè)備封裝: 8-SOICN
包裝: 帶卷 (TR)
10
FN6051.7
February 27, 2006
Human Body Model Testing
As the name implies, this test method emulates the ESD
event delivered to an IC during human handling. The tester
delivers the charge stored on a 100pF capacitor through a
1.5k
current limiting resistor into the pin under test. The
HBM method determines an IC’s ability to withstand the ESD
events typically present during handling and manufacturing.
The RS-485 pin survivability on this high ESD family has
been characterized to be in excess of
±15kV, for discharges
to GND.
Typical Performance Curves VCC = 5V, TA = 25°C, ISL8487E, ISL81487L and ISL81487E;
Unless Otherwise Specified
FIGURE 6. DRIVER OUTPUT CURRENT vs DIFFERENTIAL
OUTPUT VOLTAGE
FIGURE 7. DRIVER DIFFERENTIAL OUTPUT VOLTAGE vs
TEMPERATURE
FIGURE 8. DRIVER OUTPUT CURRENT vs SHORT CIRCUIT
VOLTAGE
FIGURE 9. SUPPLY CURRENT vs TEMPERATURE
DIFFERENTIAL OUTPUT VOLTAGE (V)
DRIVER
OUTPUT
CURRENT
(m
A)
012
345
0
10
20
30
40
50
60
70
80
90
-40
0
50
85
2
2.2
2.4
2.6
2.8
3
3.2
3.4
3.6
TEMPERATURE (°C)
DIFFERENTIAL
OUTPUT
VOL
TAGE
(V)
-25
25
75
RDIFF = 54
RDIFF = 100
OUTPUT VOLTAGE (V)
-7 -6
-4
-2
0
2
4
6
8
10
12
OUTPUT
CUR
RE
NT
(mA)
-60
-40
-20
0
20
40
60
80
100
120
140
160
-80
-100
-120
Y OR Z = HIGH
Y OR Z = LOW
ISL81487E
ISL8487E, ISL81487L
100
150
200
250
300
350
-40
0
50
85
TEMPERATURE (°C)
I CC
(A)
-25
25
75
ISL81487E, DE = VCC, RE = X
ISL8487E, ISL81487L, DE = VCC, RE = X
ISL81487E, DE = GND, RE = X
ISL8487E, ISL81487L, DE = GND, RE = GND
400
ISL8487E, ISL81487L, ISL81487E
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