Specifications ispLSI 1024 4 Switching Test Conditions Input Pulse Levels GND to 3.0V Input Rise and Fall Time ≤ 3ns 10% to 90% Input Timing Re" />
參數(shù)資料
型號: ISPLSI 1024-90LJ
廠商: Lattice Semiconductor Corporation
文件頁數(shù): 10/14頁
文件大?。?/td> 0K
描述: IC PLD ISP 48I/O 12NS 68PLCC
標準包裝: 18
系列: ispLSI® 1000
可編程類型: 系統(tǒng)內(nèi)可編程
最大延遲時間 tpd(1): 12.0ns
電壓電源 - 內(nèi)部: 4.75 V ~ 5.25 V
邏輯元件/邏輯塊數(shù)目: 24
門數(shù): 4000
輸入/輸出數(shù): 48
工作溫度: 0°C ~ 70°C
安裝類型: 表面貼裝
封裝/外殼: 68-LCC(J 形引線)
供應(yīng)商設(shè)備封裝: 68-PLCC(24.23x24.23)
包裝: 管件
其它名稱: ISPLSI1024-90LJ
Specifications ispLSI 1024
4
Switching Test Conditions
Input Pulse Levels
GND to 3.0V
Input Rise and Fall Time
≤ 3ns 10% to 90%
Input Timing Reference Levels
1.5V
Output Timing Reference Levels
1.5V
Output Load
See figure 2
3-state levels are measured 0.5V from steady-state
active level.
Table 2- 0003
DC Electrical Characteristics
Over Recommended Operating Conditions
VOL
VOH
IIL
IIH
IIL-isp
IIL-PU
IOS1
ICC2,4
1. One output at a time for a maximum duration of one second. V
out = 0.5V was selected to avoid test problems by tester ground
degradation. Characterized but not 100% tested.
2. Measured using six 16-bit counters.
3. Typical values are at V
CC = 5V and TA = 25
oC.
4. Maximum I
CC varies widely with specific device configuration and operating frequency. Refer to the Power Consumption sec-
tion of this datasheet and Thermal Management section of the Lattice Semiconductor Data Book and CD-ROM to estimate maximum
I
CC.
I
OL =8 mA
I
OH =-4 mA
0V
≤ V
IN ≤ VIL (MAX.)
3.5V
≤ V
IN ≤ VCC
0V
≤ V
IN ≤ VIL (MAX.)
0V
≤ V
IN ≤ VIL
V
CC = 5V, VOUT = 0.5V
V
IL = 0.5V, VIH = 3.0V
Commercial
f
TOGGLE = 1 MHz
Industrial/Military
0.4
-10
10
-150
-200
190
215
V
A
mA
SYMBOL
Output Low Voltage
Output High Voltage
Input or I/O Low Leakage Current
Input or I/O High Leakage Current
isp Input Low Leakage Current
I/O Active Pull-Up Current
Output Short Circuit Current
Operating Power Supply Current
CONDITION
MIN.
UNITS
MAX.
TYP.3
130
135
2.4
PARAMETER
Table 2-0007A-24 w/mil
Figure 2. Test Load
+ 5V
R1
R2
CL*
Device
Output
Test
Point
*CL includes Test Fixture and Probe Capacitance.
Output Load Conditions (see figure 2)
Test Condition
R1
R2
CL
A
470
390
35pF
B
Active High
390
35pF
Active Low
470
390
35pF
Active High to Z
390
5pF
Cat V
OH - 0.5V
Active Low to Z
470
390
5pF
at V
OL + 0.5V
Table 2- 0004A
ALL
DEVICES
DISCONTINUED
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