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參數(shù)資料
| 型號： | JAN2N457B |
| 英文描述： | TRANSISTOR | BJT | PNP | 40V V(BR)CEO | 7A I(C) | TO-3 |
| 中文描述： | 晶體管|晶體管|進(jìn)步黨| 40V的五（巴西）總裁| 7A條一（c）|至3 |
| 文件頁數(shù)： | 7/19頁 |
| 文件大小： | 103K |
| 代理商： | JAN2N457B |
MIL-PRF-19500/512E
15
TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Symbol
Limits
Unit
Method
Conditions
Min
Max
Subgroup 4
Magnitude of common
emitter small-signal
short-circuit forward-
current transfer ratio
3306
VCE = 10 V dc; IC = 50 mA dc;
f = 100 MHz
| hfe |
1.5
6.0
Open circuit output
capacitance
3236
VCB = 10 V dc; IE = 0
100 kHz
≤ f ≤ 1 MHz
Cobo
20
pF
Input capacitance
(output open-circuited)
3240
VEB = 0.5 V dc; IC = 0;
100 kHz
≤ f ≤ 1 MHz
Cibo
80
pF
Pulse response
On-time
3251
Test condition A; IC = 500 mA dc;
IB1 = 50 mA dc; (see figure 6)
td
15
ns
Rise time
3251
Test condition A; IC = 500 mA dc;
IB1 = 50 mA dc; (see figure 6)
tr
25
ns
Storage time
3251
Test condition A; IC = 500 mA dc;
IB1 = 50 mA dc; (see figure 7)
ts
175
ns
Fall time
3251
Test condition A; IC = 500 mA dc;
IB1 = 50 mA dc; (see figure 7)
tf
35
Ns
Subgroups 5, 6, and 7
Not applicable
1/ For sampling plan see MIL-PRF-19500.
2/ For resubmission of failed subgroup A1, double the sample size of the failed test or sequence of tests. A failure
in group A, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun upon
submission.
3/ Separate samples may be used.
4/ Not required for JANS devices.
5/ Not required for laser marked devices.
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| JAN2N458B | 制造商:n/a 功能描述:2N4588 |
| JAN2N458E | 制造商:n/a 功能描述:2N458 (5961-00-951-6295) |
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| JAN2N466 | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:TRANSISTOR | BJT | PNP | 20V V(BR)CEO | 100MA I(C) | TO-5 |
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