
Microsemi
Scottsdale Division
8700 E. Thomas Rd. PO Box 1390, Scottsdale, AZ 85252 USA, (480) 941-6300, Fax: (480) 947-1503
Page 3
Copyright
2002
11-05-03 REV C
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SCOTTSD A L E DIVISION
1N4099UR thru 1N4135UR
(or MLL4099 thru MLL4135)
and
1N4614UR thru 1N4627UR
(or MLL4614 thru MLL4627)
1N40
99
UR–
1N4
135
UR
1N46
14
UR
–
1N46
27
UR
GRAPHS and CIRCUIT
P
dRated
Po
wer
Dissipation
(m
W
)
TEC
TA
TEC, End Cap Temperature (
oC) or TA
Ambient temperature on FR4 PC board
FIGURE 2 Power Derating Curve
Capacitance vs. VZ Curve
FIGURE 1 Noise Density Measurement Circuit
FIGURE 3 Capacitance vs. Zener Voltage (Typical)
Zener Voltage VZ
T
ypical
C
apacita
nce
in
Picofarads
(pf)
Noise density, (ND) is specified in microvolt-rms per squre-
root-hertz. Actual measurement is performed using a 1 KHz
to 3 KHz frequency bandpass filter at a constant Zener test
current (IZT) AT 25
oC ambient temperature. ND is calculated
from the formula.
PACKAGE DIMENSIONS
INCHES
MILLIMETERS
DIM
MIN
MAX
MIN
MAX
A
0.063
0.067
1.60
1.70
B
0.130
0.146
3.30
3.70
C
0.016
0.022
0.41
0.55
PAD LAYOUT
INCHES
mm
A
.200
5.08
B
.055
1.40
C
.080
2.03