
MJCD4001B-X REV 1A0
MICROCIRCUIT DATA SHEET
Electrical Characteristics
DC PARAMETERS: DRIFT VALUES
(The following conditions apply to all the following parameters, unless otherwise specified.)
DC:
Delta calculations performed at production burn-in and Group C (operational life test).
SYMBOL
PARAMETER
CONDITIONS
NOTES
PIN-
NAME
MIN
MAX
UNIT
SUB-
GROUPS
ISS
Power Supply
Current
VDD=18.0V, VINH=18.0V, VM=0.0V, one
input per gate at VINH, other inputs
at 0.0V
12
VSS
-10
10
nA
1
VDD=18.0V, VINL=0.0V, all inputs at
VINL
12
VSS
-10
10
nA
1
IOL
Output Low
Current
VDD=5.0V, VINH=5.0V, VOL=0.4V
12
OUTPUTS -15
15
%
1
IOH
Output High
Current
VDD=5.0V, VINL=0.0V, VOH=4.6V
12
OUTPUTS -15
15
%
1
Note 1:
Screen tested 100% on each device at +25C, +125C and -55C temperature, subgroups A1,
2 and 3.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25C, +125C and -55C
temperature, subgroups A1, 2 and 3.
Screen tested 100% on each device at +25C and +125C temperature only, subgroups A1
and 2.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25C and +125C temperature
only, subgroups A1 and 2.
Screen tested 100% on each device at +25C temperature only, subgroup A1.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25C temperature only,
subgroup A1.
Screen tested 100% on each device at +25C temperature only, subgroup A9.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25C, +125C and -55C
temperature, subgroups A9, 10 and 11.
VIL, VIH, IOL and IOH are guaranteed by applying specified conditions and testing VOL
and VOH.
Note 10: Guaranteed parameter. This test is only performed during qualification.
Note 11: Guaranteed parameter, not tested.
Note 12: Drift Values need not be calculated if post burn-in electrical test is performed
within 24 hours after burn-in.
Note 2:
Note 3:
Note 4:
Note 5:
Note 6:
Note 7:
Note 8:
Note 9:
5