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| 型號： | JM4049ABEA |
| 英文描述： | Buffer/Driver |
| 中文描述： | 緩沖器/驅(qū)動器 |
| 文件頁數(shù)： | 4/5頁 |
| 文件大?。?/td> | 16K |
| 代理商： | JM4049ABEA |
MJCD4049A-X REV 1A0
MICROCIRCUIT DATA SHEET
Electrical Characteristics
AC PARAMETERS
(The following conditions apply to all the following parameters, unless otherwise specified.)
AC:
VDD=5.0V, CL=50pF, RL=200K Ohms to ground, Tr/Tf=10nS + 2nS
SYMBOL
PARAMETER
CONDITIONS
NOTES
PIN-
NAME
MIN
MAX
UNIT
SUB-
GROUPS
tpHL
Propagation Delay
Time
7, 8 In to
On
6
150
nS
9, 11
7, 8 In to
On
9
225
nS
10
tpLH
Propagation Delay
Time
7, 8 In to
On
6
230
nS
9, 11
7, 8 In to
On
9
345
nS
10
tTHL
Transition Time
7, 8 On
6
70
nS
9, 11
7, 8 On
9
105
nS
10
tTLH
Transition Time
7, 8 On
6
270
nS
9, 11
7, 8 On
9
405
nS
10
Cin
Input Capacitance
VDD=Gnd, f=1MHz
10
INPUTS
20
pF
4
DC PARAMETERS: DRIFT VALUES
(The following conditions apply to all the following parameters, unless otherwise specified.)
DC:
Delta calculations performed at production burn-in and Group C (operational life test).
ISS
Power Supply
Current
VDD=15.0V, VIN=15.0V or VIN=0.0V,
VM=0.0V
12
VSS
-20.0
20.0
nA
1
VOL1
Output Low
Voltage
VDD=5.5V, VIH=3.95V, IOL=0.23ma
12
OUTPUTS -0.04
0.04
V
1
VOH1
Output High
Voltage
VDD=4.5V, VIL=0.9V, IOH=-0.10ma
12
OUTPUTS -0.08
0.08
V
1
Note 1:
Screen tested 100% on each device at +25C, +125C and -55C temperature, subgroups A1,
2 and 3.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25C, +125C and -55C
temperature, subgroups A1, 2 and 3.
Screen tested 100% on each device at +25C and +125C temperature only, subgroup A1 and
2.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25C and +125C temperature
only, subgroup A1 and 2.
Screen tested 100% on each device at +25C temperature only, subgroup A1.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25C temperature only,
subgroup A1.
Screen tested 100% on each device at +25C temperature only, subgroup A9.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25C, +125C and -55C
temperature, subgroups A9, 10 and 11.
VIL, VIH, IOL and IOH are guaranteed by applying specified conditions and testing VOL
and VOH.
Note 10: Guaranteed parameter. This test is only performed during qualification.
Note 11: Guaranteed parameter, not tested.
Note 12: Drift values need not be calculated if post burn-in electrical test is performed
within 24 hours after burn-in.
Note 2:
Note 3:
Note 4:
Note 5:
Note 6:
Note 7:
Note 8:
Note 9:
4
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