參數(shù)資料
型號: KM684002BI
廠商: SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述: 512Kx8 Bit High Speed CMOS Static RAM(512K x 8位高速CMOS 靜態(tài) RAM)
中文描述: 512Kx8位高速CMOS靜態(tài)RAM(為512k × 8位高速的CMOS靜態(tài)RAM)的
文件頁數(shù): 4/8頁
文件大?。?/td> 129K
代理商: KM684002BI
KM684002B, KM684002BI
CMOS SRAM
PRELIMINARY
Rev 2.1
June 1998
- 4 -
TEST CONDITIONS
NOTE: The above test conditions are also applied at industrial temperature range.
Parameter
Value
Input Pulse Levels
0V to 3V
Input Rise and Fall Times
3ns
Input and Output timing Reference Levels
1.5V
Output Loads
See below
AC CHARACTERISTICS
(T
A
=0 to 70
°
C, V
CC
=5.0V
±
10%, unless otherwise noted.)
Output Loads(B)
for t
HZ
, t
LZ
, t
WHZ
, t
OW
, t
OLZ
& t
OHZ
D
OUT
5pF*
480
255
+5.0V
* Including Scope and Jig Capacitance
READ CYCLE
NOTE: The above parameters are also guaranteed at industrial temperature range.
Parameter
Symbol
KM684002B-10
KM684002B-12
KM684002B-15
Unit
Min
Max
Min
Max
Min
Max
Read Cycle Time
t
RC
10
-
12
-
15
-
ns
Address Access Time
t
AA
-
10
-
12
-
15
ns
Chip Select to Output
t
CO
-
10
-
12
-
15
ns
Output Enable to Valid Output
t
OE
-
5
-
6
-
7
ns
Chip Enable to Low-Z Output
t
LZ
3
-
3
-
3
-
ns
Output Enable to Low-Z Output
t
OLZ
0
-
0
-
0
-
ns
Chip Disable to High-Z Output
t
HZ
0
5
0
6
0
7
ns
Output Disable to High-Z Output
t
OHZ
0
5
0
6
0
7
ns
Output Hold from Address Change
t
OH
3
-
3
-
3
-
ns
Chip Selection to Power Up Time
t
PU
0
-
0
-
0
-
ns
Chip Selection to Power DownTime
t
PD
-
15
-
12
-
15
ns
Output Loads(A)
D
OUT
R
L
= 50
Z
O
= 50
V
L
= 1.5V
30pF*
* Capacitive Load consists of all components of the
test environment.
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KM684002I-17 制造商:SAMSUNG 制造商全稱:Samsung semiconductor 功能描述:512Kx8 Bit High Speed Static RAM(5V Operating), Revolutionary Pin out. Operated at Commercial, Extended and Industrial Temperature Range.
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