參數(shù)資料
型號： KWT824
廠商： SEOUL SEMICONDUCTOR CO LTD
元件分類： LED
英文描述： FLASH LED DEVICE
中文描述： SINGLE COLOR LED, WHITE, 2.4 mm
封裝： ROHS COMPLIANT, PLASTIC, SMT, LCC-4
文件頁數(shù)： 11/11頁
文件大小： 520K
代理商： KWT824
12. RELIABILITY
(1) TEST ITEMS AND RESULTS
TEST ITEM
Test conditions
Test Time
Number of
Damaged
Judgment
Resistance to
Soldering Heat
*1
T
sld
= 260
℃
,
10 sec.
1 Time
0 /22
OK.
Solderability
*1
T
sld
= 215
±
5
℃
,
5 sec.
1 Time
0 /22
OK.
Thermal Shock
*1
-30
℃
(30 min) ~ 85
℃
(30 min)
Transfer 5 min
100 cycles
0 /22
OK.
High Temperature
Storage
*1
T
a
= 100
℃
1000 hrs.
0 /22
OK.
Humidity
Heat Load
*1
T
a
= 85
℃
,
RH
= 85%
1000 hrs.
0 /22
OK.
Steady State
Life Test
T
a
= 25
℃
,
I
F
= 20 mA/die
300 hrs
0 /22
OK.
High Humidity
Heat Life Test
T
a
= 85
℃
,
RH
= 85%,
I
F
= 10 mA/die
300 hrs
0 /22
OK.
Low Temperature
Life Test
T
a
= -30
℃
,
I
F
= 20 mA/die
300 hrs
0 /22
OK.
Pulse Life Test
T
a
= 60
℃
,
RH
= 90%
On=2 sec,Off=2sec
I
F
= 30 mA/die
100,000 cycle
0 /22
OK.
*
1
Faulty decision of this test item is made by On / Off after the test.
(2) CRITERIA FOR JUDGING THE DAMAGE
Criteria for Judgement
Min.
L.S.L×1.2
Item
Symbol
Test Condition
Max.
U.S.L×1.2
Forward Voltage
V
F
I
F
= 20 mA/die
Reverse Current
I
R
V
R
= 5 V/die
-
U.S.L×2.0
Luminous Intensity
I
V
I
F
= 20 mA/die
L.S.L×0.5
-
U.S.L. : Upper Standard Level
L.S.L. : Lower Standard Level
(3)ESD guarantee condition
Item
Test Condition
Criteria for Judgement
Test Form
HBM
1000
V
I
R
=100
and below
CONTACT
SEOUL SEMICONDUCTOR CO,. LTD.
148-29 Kasan-Dong, Keumchun-Gu, Seoul, Korea
TEL: 82-2-3281-6269 FAX: 82-2-858-5537
- 11/11
VVF0]FZW;57N
SSC-QP-0401-06(REV0.0)
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