6
Le79555 Data Sheet
ABSOLUTE MAXIMUM RATINGS
Storage temperature.........................
–
55
°
C to +150
°
C
V
CC
with respect to AGND.................
–
0.4 V to +7.0 V
V
BAT1
, V
BAT2
with respect to AGND:
Continuous..................................... +0.4 V to
–
70 V
10 ms............................................. +0.4 V to
–
75 V
BGND with respect to AGND................... +3 V to
–
3 V
A(TIP) or B(RING) to BGND:
Continuous .........................................V
BAT
to +1 V
10 ms (f = 0.1 Hz).............................
–
70 V to +5 V
1 μs (f = 0.1 Hz)................................
–
80 V to +8 V
250 ns (f = 0.1 Hz)..........................
–
90 V to +12 V
Current from A(TIP) or B(RING).....................±150 mA
RINGOUT/RYOUT1,2 current............................50 mA
RINGOUT/RYOUT1,2 voltage .............. BGND to +7 V
RINGOUT/RYOUT1,2 transient.......... BGND to +10 V
DA and DB inputs
Voltage on ring-trip inputs.....................V
BAT
to 0 V
Current into ring-trip inputs .........................±10 mA
C3
–
C1,D2
–
D1, BATSW, CHCLK
Input voltage .........................
–
0.4 V to V
CC
+ 0.4 V
Maximum power dissipation, continuous,
T
A
= 70
°
C, No heat sink (See note)
In 44-pin TQFP package................................1.4 W
Thermal Data:
................................................................θ
JA
In 44-pin TQFP package.......................52
°
C/W typ
ESD immunity/pin (HBM)..................................1500 V
Note:
Thermal limiting circuitry on-chip will shut down the cir-
cuit at a junction temperature of about 165
°
C. The device
should never see this temperature and operation above 145
°
C
junction temperature may degrade device reliability.
Stresses above those listed under Absolute Maximum
Ratings may cause permanent device failure. Functionality
at or above these limits is not implied. Exposure to
absolute maximum ratings for extended periods may affect
device reliability.
OPERATING RANGES
Commercial (C) Devices
Ambient temperature .............................0
°
C to +70
°
C*
V
CC
.....................................................4.75 V to 5.25 V
V
BAT1
, V
BAT2
.........................................
–
15 V to
–
58 V
AGND......................................................................0 V
BGND with respect to
AGND...................................
–
100 mV to +100 mV
Load resistance on VTX to ground ..............20 k
min
*The operating ranges define those limits between which the
functionality of the device is guaranteed.
* Functionality of the device from 0
°
C to +70
°
C is guaranteed
by production testing. Performance from
–
40
°
C to +85
°
C is
guaranteed by characterization and periodic sampling of
production units.