參數(shù)資料
型號： LH28F400BG-L12
廠商： Sharp Corporation
英文描述： 4M-BIT(256KBx16) SmartVoltage Flash MEMORY
中文描述： 4分位（256KBx16）SmartVoltage閃光記憶
文件頁數(shù)： 20/35頁
文件大?。?/td> 294K
代理商： LH28F400BG-L12
LH28F400SU-NC
4M (512K × 8, 256K × 16) Flash Memory
20
Timing Nomenclature
For 5.0 V systems use the standard JEDEC cross point definitions.
Each timing parameter consists of 5 characters. Some common examples are defined below:
t
CE
t
OE
t
ACC
t
AVQV
t
AS
t
DH
t
ELQV
t
GLQV
time (t) from CE
(E) going low (L) to the outputs (Q) becoming valid (V)
time (t) from OE
(G) going low (L) to the outputs (Q) becoming valid (V)
time (t) from address (A) valid (V) to the outputs (Q) becoming valid (V)
t
AVWH
t
WHDX
time (t) from address (A) valid (V) to WE
(W) going high (H)
time (t) from WE
(W) going high (H) to when the data (D) can become undefined (X)
Figure 15. Transient Input/Output
Reference Waveform (V
CC
= 5.0 V ±0.5 V)
Figure 17. Transient Equivalent Testing
Load Circuit (V
CC
= 5.0 V ±0.5 V)
PIN CHARACTERS
PIN STATES
A
Address Inputs
H
High
D
Data Inputs
L
Low
Q
Data Outputs
V
Valid
E
CE
(Chip Enable)
X
Driven, but not necessarily valid
G
OE
(Output Enable)
Z
High Impedance
W
WE (Write Enable)
P
RP
(Deep Power-Down Pin)
R
RY
/BY
(Ready/Busy)
V
Any Voltage Level
5 V
V
CC
at 4.5 V Min.
INPUT
TEST POINTS
OUTPUT
2.4
0.45
2.0
0.8
2.0
0.8
28F400SUT-NC60-13
NOTE:
AC test inputs are driven at V
OH
(2.4 V
TTL
) for a Logic '1' and V
OL
(0.45 V
TTL
) for a Logic '0'. Input timing begins at V
IH
(2.0 V
TTL
)
and V
IL
(0.8 V
TTL
). Output timing ends at V
IH
and V
IL
. Input rise
and fall times (10% to 90%) < 10 ns.
Figure 16. Transient Input/Output
Reference Waveform (V
CC
= 5.0 V ±.25 V)
2.5 ns OF 25
TRANSMISSION LINE
TOTAL CAPACITANCE = 100 pF
FROM OUTPUT
UNDER TEST
TEST
POINT
28F400SUT-NC60-15
Figure 18. Transient Equivalent Testing
Load Circuit (V
CC
= 5.0 V ±.25 V)
2.5 ns OF 83
TRANSMISSION LINE
TOTAL CAPACITANCE = 30 pF
FROM OUTPUT
UNDER TEST
TEST
POINT
28F400SUT-NC60-16
INPUT
0.0
TEST POINTS
OUTPUT
3.0
1.5
1.5
28F400SUT-NC60-14
NOTE:
AC test inputs are driven at 3.0 V for a Logic '1'
and 0.0 V for a Logic '0'. Input timing begins,
and output timing ends at 1.5 V. Input rise
and fall times (10% to 90%) < 10 ns.
相關PDF資料
PDF描述
LH28F400BG-L85 4M-BIT(256KBx16) SmartVoltage Flash MEMORY
LH28F400SU-LC 4M (512K 】 8, 256K 】 16) Flash Memory
LH28F400SUN-LC12 4Mbit(512Kbit x 8,256Kbit x 16) 3.3V Flash Memory
LH28F400SUHN 4M Flash Memory
LH28F400SUHT 4Mbit(512Kbit x 8,256 Kbit x 16) 5V Single Voltage Flash Memory
相關代理商/技術參數(shù)
參數(shù)描述
LH28F400BG-L85 制造商:SHARP 制造商全稱:Sharp Electrionic Components 功能描述:4M-BIT(256KBx16) SmartVoltage Flash MEMORY
LH28F400BG-L85/12 制造商:SHARP 制造商全稱:Sharp Electrionic Components 功能描述:4M-BIT (256KB x16) SmartVoltage Flash MEMORY
LH28F400BGN-BL12 制造商:未知廠家 制造商全稱:未知廠家 功能描述:x16 Flash EEPROM
LH28F400BGN-BL85 制造商:未知廠家 制造商全稱:未知廠家 功能描述:x16 Flash EEPROM
LH28F400BGN-TL12 制造商:未知廠家 制造商全稱:未知廠家 功能描述:x16 Flash EEPROM
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