參數(shù)資料
型號: LH28F400SU-LC
廠商: Sharp Corporation
英文描述: 4M (512K 】 8, 256K 】 16) Flash Memory
中文描述: 4分(為512k】8,256K】16)快閃記憶體
文件頁數(shù): 29/35頁
文件大小: 294K
代理商: LH28F400SU-LC
4M (512K × 8, 256K × 16) Flash Memory
LH28F400SU-NC
29
AC Characteristics for CE
- Controlled Command Write Operations
1
V
CC
= 5.0 V ± 0.5 V, T
A
= 0°C to +70°C
NOTES:
1. Read timing during write and erase are the same as for normal read.
2. Refer to command definition tables for valid address and data values.
3. Sampled, but not 100% tested.
4. Write/Erase durations are measured to valid Status Register (CSR) Data.
5. Byte Write operations are typically performed with 1 Programming Pulse.
6. Address and Data are latched on the rising edge of CE
for all Command Write operations.
SYMBOL
PARAMETER
TYP.
V
CC
= 5.0 V ± 0.25 V V
CC
= 5.0 V ± 0.5 V
MIN.
MAX.
UNITS
NOTE
MIN.
MAX.
t
AVAV
t
PHWL
t
VPEH
t
WLEL
t
AVEH
t
DVEH
t
ELEH
t
EHDX
t
EHAX
t
EHWH
t
EHEL
t
GHEL
t
EHRL
Write Cycle Time
60
70
ns
RP
Setup to WE Going Low
400
430
ns
3
V
PP
Set up to CE
Going High
WE Setup to CE
Going Low
100
100
ns
3
0
0
ns
Address Setup to CE
Going High
55
60
ns
2, 6
Data Setup to CE
Going High
55
60
ns
2, 6
CE
Pulse Width
55
60
ns
Data Hold from CE
High
0
0
ns
2
Address Hold from CE
High
10
10
ns
2
WE Hold from CE
High
10
10
ns
CE
Pulse Width High
30
30
ns
Read Recovery before Write
0
0
ns
CE
High to RY
/BY
Going Low
100
100
ns
t
RHPL
RP
Hold from Valid Status Register
Data and RY
/BY
High
0
0
ns
3
t
PHEL
t
EHGL
RP
High Recovery to CE
Going Low
1
1
μs
Write Recovery before Read
60
65
ns
t
QVVL
V
PP
Hold from Valid Status Register
Data and RY
/BY
High
0
0
μs
t
EHQV1
t
EHQV2
Duration of Byte Write Operation
13
4.5
4.5
μs
4, 5
Duration of Block Erase Operation
0.3
0.3
s
4
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