參數(shù)資料
型號: LK5660-7RD3B1
廠商: POWER-ONE INC
元件分類: 電源模塊
英文描述: 2-OUTPUT 150 W AC-DC PWR FACTOR CORR MODULE
封裝: METAL, CASE K02, MODULE
文件頁數(shù): 25/28頁
文件大小: 1215K
代理商: LK5660-7RD3B1
K Series
AC-DC Converters >100 Watt
Rugged Environment
Edition 4/4.99
6/28
MELCHER
The Power Partners.
Electrical Output Data
General Conditions
TA = 25
°C, unless T
C is specied.
– Pin 18 (i) connected to pin 14 (S–/Vo1–),
Uo adjusted to Uo nom (option P), R input not connected.
– Sense line pins 12 (S+) and 14 (S–) connected to 4 (Vo1+) and 8 (Vo1–) respectively.
Table 4a: Output data single output modules
Output
LK 4003-6
LK 4301
LK 4501
LK 4601
5.1 V
12.0 V
15.0 V
24.0 V
Characteristics
Conditions
min
typ
max
min
typ
max
min
typ
max
min
typ
max
Unit
Uo
Output voltage
Ui nom, Io nom
5.07
5.13
11.93
12.07 14.91
15.09 23.86
24.14
V
Uo P
Overvoltage protection
7.6
21
26.5
43.5
Io nom
Output current 1
Ui min...Ui max
25.0
12.0
10.0
6.0
A
TC min...TC max
IoL
Output current limit 4
Ui min...Ui max
26
12.2
10.2
6.2
uo 7
Output
Low frequency
Ui nom, Io nom
2222
mVpp
voltage
Switching freq.
IEC/EN 6120
15
555
noise
Total
BW = 20 MHz
50
40
50
DUo u
Static line regulation
Ui min...Ui nom,
±5
±12
±15
±24 mV
Ui nom...Ui max
Io nom
DUo I
Static load regulation
Ui nom, Io =
202430
48
(0.1...1)
Io nom
uo d 5
Dynamic
Voltage
Ui nom
±170
±150
±100
load
deviation
Io nom 1/2 Io nom
td5
regulation
Recovery
IEC/EN 61204
0.3
0.4
0.3
ms
time
aUo
Temperature coefcient
TC min...TC max
–0.5
–1.5
mV/K
of output voltage 6
0...
Io nom
1 If the output voltages are increased above Uo nom through R-input control, option P setting, remote sensing or option T, the output cur-
rents should be reduced accordingly so that
Po nom is not exceeded.
4 See: Typical Output Voltage Regulation of Single or Double Output Modules with Outputs 1 and 2 Connected in Series.
5 See: Typical dynamic load regulation of Uo1 and Uo2.
6 Negative temperature coefcient (0...–3 mV/cell and K) available on request.
7 Measured according to IEC/EN 61204 sub clause 3.10 with a probe acc. to annex A of the same standards. (See: Technical Informa-
tion: Measuring and Testing.)
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