參數(shù)資料
型號(hào)： LN87C51FA
廠商： INTEL CORP
元件分類： 微控制器/微處理器
英文描述： CHMOS SINGLE-CHIP 8-BIT MICROCONTROLLER
中文描述： 8-BIT, OTPROM, 12 MHz, MICROCONTROLLER, PQCC44
封裝： PLASTIC, LCC-44
文件頁(yè)數(shù)： 9/18頁(yè)
文件大小： 250K
代理商： LN87C51FA
AUTOMOTIVE 87C51FA/FB/FC/FC-20
NOTES:
1. Capacitive loading on Ports 0 and 2 may cause noise pulses above 0.4V to be superimposed on the V
OL
s of ALE and
Ports 1, 2 and 3. The noise is due to external bus capacitance discharging into the Port 0 and Port 2 pins when these pins
change from 1 to 0. In applications where capacitive loading exceeds 100 pF, the noise pulses on these signals may exceed
0.8V. It may be desirable to qualify ALE or other signals with Schmitt triggers or CMOS-level input logic.
2. Capacitive loading on Ports 0 and 2 cause the V
OH
on ALE and PSEN to drop below the 0.9 V
CC
specification when the
address lines are stabilizing.
3. See Figures 6–9 for test conditions. Minimum V
CC
for Power Down is 2V.
4. Typicals are based on limited number of samples and are not guaranteed. The values listed are at room temperature and
5V.
5. Under steady state (non-transient) conditions, I
OL
must be externally limited as follows:
Maximum I
OL
per port pin:
10mA
Maximum I
OL
per 8-bit portD
Port 0:
26 mA
Ports 1, 2 and 3:
15 mA
Maximum total I
OL
for all output pins:
71 mA
If I
OL
exceeds the test condition, V
OL
may exceed the related specification. Pins are not guaranteed to sink current greater
than the listed test conditions.
270961–7
I
CC
Max at other frequencies is given by:
Active Mode
I
CC
Max
e
(1.25
c
Osc Freq)
a
15
Idle Mode
I
CC
Max
e
(0.5
c
Osc Freq)
a
4
Where Osc Freq is in MHz, I
CC
is in mA.
Figure 6. I
CC
vs Frequency
All other pins disconnected
TCLCH
e
TCHCL
e
5 ns
270961–8
Figure 7. I
CC
Test Condition, Active Mode
All other pins disconnected
TCLCH
e
TCHCL
e
5 ns
270961–9
Figure 8. I
CC
Test Condition Idle Mode
All other pins disconnected
270961–10
Figure 9. I
CC
Test Condition, Power Down Mode.
V
CC
e
2.0V to 5.5V.
270961–11
Figure 10. Clock Signal Waveform for I
CC
Tests in Active and Idle Modes. TCLCH
e
TCHCL
e
5 ns.
9
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