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參數(shù)資料
| 型號： | LTC1401I |
| 廠商： | Linear Technology Corporation |
| 英文描述： | Complete SO-8, 12-Bit, 200ksps ADC with Shutdown |
| 中文描述： | 完整的SO - 8，12位，高達200ksps ADC的帶有關(guān)斷 |
| 文件頁數(shù)： | 7/20頁 |
| 文件大小： | 352K |
| 代理商： | LTC1401I |
7
LTC1401
APPLICATIO
S I
N
FOR
ATIO
U
Conversion Details
The LTC1401 uses a successive approximation algorithm
and an internal sample-and-hold circuit to convert an
analog signal to a 12-bit serial output based on a precision
internal reference. The control logic provides an easy
interface to microprocessors and DSPs through serial
3-wire connections.
A rising edge on the CONV input starts a conversion. At the
start of a conversion the successive approximation regis-
ter (SAR) is reset. Once a conversion cycle has begun, it
cannot be restarted.
During conversion, the internal 12-bit capacitive DAC
output is sequenced by the SAR from the most significant
bit (MSB) to the least significant bit (LSB). Referring to
Figure 1, the A
IN
input connects to the sample-and-hold
capacitor during the acquire phase and the comparator
offset is nulled by the feedback switch. In this acquire
phase, it typically takes 315ns for the sample-and-hold
capacitor to acquire the analog signal. During the convert
phase, the comparator feedback switch opens, putting the
comparator into the compare mode. The input switches
C
SAMPLE
to ground, injecting the analog input charge onto
the summing junction. This input charge is successively
compared with the binary-weighted charges supplied by
the capacitive DAC. Bit decisions are made by the high
speed comparator. At the end of a conversion, the DAC
W
U
output balances the A
IN
input charge. The SAR contents (a
12-bit data word) which represent the input voltage, are
presented through the serial pin D
OUT
.
Dynamic Performance
The LTC1401 has excellent high speed sampling capabil-
ity. FFT (Fast Fourier Transform) test techniques are used
to test the ADC’s frequency response, distortion and noise
at the rated throughput. By applying a low distortion sine
wave and analyzing the digital output using an FFT algo-
rithm, the ADC’s spectral content can be examined for
frequencies outside the fundamental. Figure 2a shows a
typical LTC1401 FFT plot.
Figure 1. A
IN
Input
LTC1401 F01
SAMPLE
D
OUT
C
DAC
V
DAC
DAC
A
IN
C
SAMPLE
–
+
COMP
S
A
R
SAMPLE
S1
HOLD
Signal-to-Noise Ratio
The signal-to-noise plus distortion ratio [S/(N+D)] is the
ratio between the RMS amplitude of the fundamental input
frequency to the RMS amplitude of all other frequency
components at the A/D output. The output is band limited
to frequencies from DC to half the sampling frequency.
Figure 2a shows a typical spectral content with a 200kHz
sampling rate and a 50kHz input. The dynamic perfor-
mance is excellent for input frequencies up to the Nyquist
limit of 100kHz as shown in Figure 2b.
FREQUENCY (kHz)
0
20
40
50
70
90
10
30
60
80
100
A
LTC1401 F02a
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
–120
f
SAMPLE
= 200kHz
f
= 49.853516kHz
SINAD = 68.5dB
THD = –72.4dB
V
CC
= 3V
T
A
= 25
°
C
Figure 2a. LTC1401 Nonaveraged, 4096 Point FFT
Plot with 50kHz Input Frequency
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