attached to each input (C
參數(shù)資料
型號(hào)： LTC1744IFW#TR
廠商： Linear Technology
文件頁(yè)數(shù)： 5/24頁(yè)
文件大小： 0K
描述： IC ADC 14BIT 50MSPS 48-TSSOP
標(biāo)準(zhǔn)包裝： 1,800
位數(shù)： 14
采樣率（每秒）： 50M
數(shù)據(jù)接口： 并聯(lián)
轉(zhuǎn)換器數(shù)目： 1
功率耗散（最大）： 1.5W
電壓電源： 單電源
工作溫度： -40°C ~ 85°C
安裝類型： 表面貼裝
封裝/外殼： 48-TFSOP（0.240"，6.10mm 寬）
供應(yīng)商設(shè)備封裝： 48-TSSOP
包裝： 帶卷 (TR)
輸入數(shù)目和類型： 2 個(gè)單端，雙極；1 個(gè)差分，雙極
其它名稱： LTC1744IFWTR
13
LTC1744
1744f
APPLICATIO S I FOR ATIO
WU
U
given sampling capacitor size. The capacitors shown
attached to each input (CPARASITIC) are the summation of
all other capacitance associated with each input.
During the sample phase when ENC/ENC is low, the
transmission gate connects the analog inputs to the sam-
pling capacitors and they charge to and track the differen-
tial input voltage. When ENC/ENC transitions from low to
high the sampled input voltage is held on the sampling
capacitors. During the hold phase when ENC/ENC is high
the sampling capacitors are disconnected from the input
and the held voltage is passed to the ADC core for
processing. As ENC/ENC transitions from high to low the
inputs are reconnected to the sampling capacitors to
acquire a new sample. Since the sampling capacitors still
hold the previous sample, a charging glitch proportional to
the change in voltage between samples will be seen at this
time. If the change between the last sample and the new
sample is small the charging glitch seen at the input will be
small. If the input change is large, such as the change seen
with input frequencies near Nyquist, then a larger charging
glitch will be seen.
Common Mode Bias
The ADC sample-and-hold circuit requires differential
drive to achieve specified performance. Each input should
swing
±0.8V for the 3.2V range or ±0.5V for the 2V range,
around a common mode voltage of 2.5V. The VCM output
pin (Pin 2) may be used to provide the common mode bias
level. VCM can be tied directly to the center tap of a
transformer to set the DC input level or as a reference level
to an op amp differential driver circuit. The VCM pin must
be bypassed to ground close to the ADC with 4.7
F or
greater.
Input Drive Impedance
As with all high performance, high speed ADCs the dy-
namic performance of the LTC1744 can be influenced by
the input drive circuitry, particularly the second and third
harmonics. Source impedance and input reactance can
influence SFDR. At the falling edge of encode the sample-
and-hold circuit will connect the 7pF sampling capacitor to
the input pin and start the sampling period. The sampling
period ends when encode rises, holding the sampled input
on the sampling capacitor. Ideally the input circuitry
should be fast enough to fully charge the sampling capaci-
tor during the sampling period 1/(2FENCODE); however,
this is not always possible and the incomplete settling may
degrade the SFDR. The sampling glitch has been designed
to be as linear as possible to minimize the effects of
incomplete settling.
For the best performance, it is recomended to have a
source impedence of 100
or less for each input. The
source impedence should be matched for the differential
inputs. Poor matching will result in higher even order
harmonics, especially the second.
Figure 2. Equivalent Input Circuit
CSAMPLE
7pF
CPARASITIC
8pF
CPARASITIC
8pF
VDD
LTC1744
AIN
+
1744 F02
CSAMPLE
7pF
BIAS
VDD
5V
AIN
–
ENC
2V
6k
2V
6k
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