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參數(shù)資料
| 型號： | LTC2162IUK#TRPBF |
| 廠商： | LINEAR TECHNOLOGY CORP |
| 元件分類： | ADC |
| 英文描述： | 1-CH 16-BIT PROPRIETARY METHOD ADC, PARALLEL ACCESS, PQCC48 |
| 封裝： | 7 X 7 MM, LEAD FREE, PLASTIC, MO-220WKKD-2, QFN-48 |
| 文件頁數(shù)： | 19/36頁 |
| 文件大小： | 651K |
| 代理商： | LTC2162IUK#TRPBF |
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LTC2162/LTC2161/LTC2160
26
216210f
Digital Output Test Patterns
To allow in-circuit testing of the digital interface to the
A/D, there are several test modes that force the A/D data
outputs (OF, D15 to D0) to known values:
All 1s: all outputs are 1
All 0s: all outputs are 0
Alternating: outputs change from all 1s to all 0s on
alternating samples.
Checkerboard: outputs change from
10101010101010101 to 01010101010101010
on alternating samples.
The digital output test patterns are enabled by serially
programming mode control register A4. When enabled,
the test patterns override all other formatting modes: 2’s
complement, randomizer, alternate bit polarity.
Output Disable
The digital outputs may be disabled by serially program-
ming mode control register A3. All digital outputs includ-
ing OF and CLKOUT are disabled. The high-impedance
disabled state is intended for in-circuit testing or long
periods of inactivity—it is too slow to multiplex a data
bus between multiple converters at full speed. When the
outputs are disabled the ADC should be put into either
sleep or nap mode.
Sleep and Nap Modes
The A/D may be placed in sleep or nap modes to conserve
power. In sleep mode the entire device is powered down,
resulting in 1mW power consumption. The amount of
time required to recover from sleep mode depends on
the size of the bypass capacitors on VREF, REFH, and
REFL. For the suggested values in Figure 8, the A/D will
stabilize after 2ms.
applicaTions inForMaTion
InnapmodetheA/Dcoreispowereddownwhiletheinternal
referencecircuitsstayactive,allowingfasterwake-upthan
from sleep mode. Recovering from nap mode requires at
least 100 clock cycles. If the application demands very
accurate DC settling then an additional 50s should be
allowed so the on-chip references can settle from the
slight temperature shift caused by the change in supply
current as the A/D leaves nap mode.
Sleep mode and nap mode are enabled by mode control
register A1 (serial programming mode), or by SDI and
SDO (parallel programming mode).
DEVICE PROGRAMMING MODES
The operating modes of the LTC2162/LTC2161/LTC2160
can be programmed by either a parallel interface or a
simple serial interface. The serial interface has more flex-
ibility and can program all available modes. The parallel
interface is more limited and can only program some of
the more commonly used modes.
Parallel Programming Mode
To use the parallel programming mode, PAR/SER should
be tied to VDD. The CS, SCK, SDI and SDO pins are binary
logic inputs that set certain operating modes. These pins
can be tied to VDD or ground, or driven by 1.8V, 2.5V, or
3.3V CMOS logic. When used as an input, SDO should be
driven through a 1k series resistor. Table 2 shows the
modes set by CS, SCK, SDI and SDO.
Table 2. Parallel Programming Mode Control Bits (PAR/SER = VDD)
PIN
DESCRIPTION
CS
Clock Duty Cycle Stabilizer Control Bit
0 = Clock Duty Cycle Stabilizer Off
1 = Clock Duty Cycle Stabilizer On
SCK
Digital Output Mode Control Bit
0 = Full Rate CMOS Output Mode
1 = Double Data Rate LVDS Output Mode
(3.5mA LVDS Current, Internal Termination Off)
SDI/SDO
Power-Down Control Bits
00 = Normal Operation
01 = Not Used
10 = Nap Mode
11 = Sleep Mode (Entire Device Powered Down)
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| LTC2161CUK#TRPBF | 1-CH 16-BIT PROPRIETARY METHOD ADC, PARALLEL ACCESS, PQCC48 |
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