converTer characTerisTics The l denotes the specificatio" />
參數(shù)資料
型號: LTC2172CUKG-14#TRPBF
廠商: Linear Technology
文件頁數(shù): 23/34頁
文件大?。?/td> 0K
描述: IC ADC 14BIT SER/PAR 65M 52-QFN
標(biāo)準(zhǔn)包裝: 2,000
位數(shù): 14
采樣率(每秒): 65M
數(shù)據(jù)接口: Serial LVDS
轉(zhuǎn)換器數(shù)目: 4
功率耗散(最大): 419mW
電壓電源: 模擬和數(shù)字
工作溫度: 0°C ~ 70°C
安裝類型: 表面貼裝
封裝/外殼: 52-WFQFN 裸露焊盤
供應(yīng)商設(shè)備封裝: 52-QFN(7x8)
包裝: 帶卷 (TR)
輸入數(shù)目和類型: 2 Differential; 2 Single-Ended
配用: DC1371A-ND - BOARD USB DATA ACQUISITION HS
LTC2172-14/
LTC2171-14/LTC2170-14
3
21721014fb
converTer characTerisTics The
l
denotes the specifications which apply over the full operating
temperature range, otherwise specifications are at TA = 25°C. (Note 5)
PARAMETER
CONDITIONS
LTC2172-14
LTC2171-14
LTC2170-14
UNITS
MIN
TYP
MAX
MIN
TYP
MAX
MIN
TYP
MAX
Resolution (No Missing Codes)
l
14
Bits
Integral Linearity Error
Differential Analog Input (Note 6) l –3.25
±1
3.25 –2.75
±1
2.75 –2.75
±1
2.75
LSB
Differential Linearity Error
Differential Analog Input
l
–0.8
±0.3
0.8
–0.8
±0.3
0.8
–0.8
±0.3
0.8
LSB
Offset Error
(Note 7)
l
–12
±3
12
–12
±3
12
–12
±3
12
mV
Gain Error
Internal Reference
External Reference
l
–2.5
–1
0.5
–2.5
–1
0.5
–2.5
–1
0.5
%FS
Offset Drift
±20
V/°C
Full-Scale Drift
Internal Reference
External Reference
±35
±25
±35
±25
±35
±25
ppm/°C
Gain Matching
External Reference
±0.2
%FS
Offset Matching
±3
mV
Transition Noise
External Reference
1.2
LSBRMS
analog inpuT The
l
denotes the specifications which apply over the full operating temperature range, otherwise
specifications are at TA = 25°C. (Note 5)
SYMBOL PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
VIN
Analog Input Range (AIN+ – AIN–)
1.7V < VDD < 1.9V
l
1 to 2
VP-P
VIN(CM) Analog Input Common Mode (AIN+ + AIN–)/2
Differential Analog Input (Note 8)
l
VCM – 100mV
VCM
VCM + 100mV
V
VSENSE
External Voltage Reference Applied to SENSE
External Reference Mode
l
0.625
1.250
1.300
V
IIN(CM)
Analog Input Common Mode Current
Per Pin, 65Msps
Per Pin, 40Msps
Per Pin, 25Msps
81
50
31
A
IIN1
Analog Input Leakage Current (No Encode)
0 < AIN+, AIN– < VDD
l
–1
1
A
IIN2
PAR/SER Input Leakage Current
0 < PAR/SER < VDD
l
–3
3
A
IIN3
SENSE Input Leakage Current
0.625 < SENSE < 1.3V
l
–6
6
A
tAP
Sample-and-Hold Acquisition Delay Time
0
ns
tJITTER
Sample-and-Hold Acquisition Delay Jitter
0.15
psRMS
CMRR
Analog Input Common Mode Rejection Ratio
80
dB
BW-3B
Full-Power Bandwidth
Figure 6 Test Circuit
800
MHz
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