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參數(shù)資料
| 型號(hào)： | LVC257A |
| 廠商： | NXP Semiconductors N.V. |
| 英文描述： | Quad 2-input multiplexer with 5 Volt tolerant inputs/outputs (3-State) |
| 中文描述： | 四2與5伏容限輸入的輸入多路復(fù)用器/輸出（3態(tài)） |
| 文件頁(yè)數(shù)： | 4/10頁(yè) |
| 文件大?。?/td> | 380K |
| 代理商： | LVC257A |
Philips Semiconductors
Product specification
74LVC257A
Quad 2-input multiplexer with 5 Volt tolerant
inputs/outputs (3-State)
1998 Jul 29
4
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
CONDITIONS
LIMITS
UNIT
MIN
2.7
1.2
0
0
0
–40
0
0
MAX
3.6
3.6
5.5
V
CC
5.5
+85
20
10
V
CC
DC supply voltage (for max. speed performance)
DC supply voltage (for low-voltage applications)
DC input voltage range
DC input voltage range; output HIGH or LOW state
DC output voltage range; output 3-State
Operating free-air temperature range
V
V
I
V
V
O
V
T
amb
°
C
t
r
, t
f
Input rise and fall times
V
CC
= 1.2 to 2.7V
V
CC
= 2.7 to 3.6V
ns/V
ABSOLUTE MAXIMUM RATINGS
1
In accordance with the Absolute Maximum Rating System (IEC 134); Voltages are referenced to GND (ground = 0V)
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
V
CC
I
IK
V
I
DC supply voltage
–0.5 to +6.5
V
DC input diode current
V
I
Note 2
0
–50
mA
DC input voltage
–0.5 to +5.5
V
I
OK
DC output diode current
V
O
V
CC
or V
O
0
50
mA
O
V
DC output voltage; output HIGH or LOW
Note 2
–0.5 to V
CC
+0.5
–0.5 to 6.5
V
DC output voltage; output 3-State
Note 2
I
O
DC output source or sink current
V
O
= 0 to V
CC
50
mA
I
GND
, I
CC
DC V
CC
or GND current
100
mA
T
stg
Storage temperature range
–65 to +150
°
C
Power dissipation per package
– plastic mini-pack (SO)
– plastic shrink mini-pack (SSOP and TSSOP)
P
TOT
above +70
°
C derate linearly with 8 mW/K
above +60
°
C derate linearly with 5.5 mW/K
500
500
mW
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
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