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參數(shù)資料
| 型號： | LVX4053 |
| 廠商： | ON SEMICONDUCTOR |
| 英文描述： | Analog Multiplexer/Demultiplexer High−Performance Silicon−Gate CMOS |
| 文件頁數(shù)： | 3/14頁 |
| 文件大?。?/td> | 156K |
| 代理商： | LVX4053 |
MC74LVX4053
http://onsemi.com
3
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
1. Tested to EIA/JESD22A114A.
2. Tested to EIA/JESD22A115A.
3. Tested to JESD22C101A.
4. Tested to EIA/JESD78.
0.5
(Referenced to V
EE
)
0.5 to
7.0
V
IS
Analog Input Voltage
V
EE
0.5 to V
CC
V
V
IN
Digital Input Voltage
(Referenced to GND)
0.5 to 7.0
mA
V
I
DC Current, Into or Out of Any Pin
20
T
STG
Storage Temperature Range
65 to
150
mA
C
T
L
Lead Temperature, 1 mm from Case for 10 Seconds
260
C
T
J
Junction Temperature under Bias
150
C
MSL
F
R
Flammability Rating
JA
143
°
UL94VO (0.125 in)
1000
450
Oxygen Index: 30% 35%
V
ESD Withstand Voltage
Human Body Model (Note 1)
V
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Max
Unit
DEVICE JUNCTION TEMPERATURE VERSUS
TIME TO 0.1% BOND FAILURES
V
V
Negative DC Supply Voltage
(Referenced to GND)
6.0
GND
V
IS
Positive DC Supply Voltage
(Referenced to GND)
EE
2.5
2.5
6.0
EE
CC
V
CC
= 5.0 V
0
20
Junction
Temperature
°
C
Time, Hours
Time, Years
80
1,032,200
117.8
90
419,300
47.9
100
178,700
20.4
110
79,600
9.4
120
37,000
4.2
130
17,800
2.0
140
8,900
1.0
1
1
10
100
1000
FAILURE RATE OF PLASTIC = CERAMIC
UNTIL INTERMETALLICS OCCUR
Figure 3. Failure Rate vs. Time Junction Temperature
N
TIME, YEARS
T
J
T
J
T
J
T
J
T
J
T
J
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