PAL/NTSC SYSTEM SHINGLE-CHIP COLOR TV SIGNAL PROCESSOR
M52340SP
MITSUBISHI ICs (TV)
1. Input SG3 and measure the rms value of output signal a
pin 52.
2. P/N is defined as follows:
V
ONEG
Measured Value(V
P-P
)X10
3
Measured Value(mVrms)
BW Video frequency characteristics
P/N = 20 log
P/N Video S/N
1. Input SS4P to VI IN.
2. Measure output amplitude, Cn1 and Cn2, at pins 41 and
43 respectively.
ACC1 ACC characteristics 1
Decrease the input level of SG18. Measure the input level
when the element of 400Hz at pin 46 is 3dB smaller than
V
0AFM
(S6:Maximum AF output (6.0M)).
1. Measure the element of 400Hz of output at pin 46.
2. ATT is defined as follows:
V
0AFmax
Measured value
ATT = 20 log
μ
AFTN is defined as follows:
(5.0-3.0)X10
3
mV
μ
AFTN=
(dB)
1. Input SG4 and set the frequency f
2
to 37.9MHz so that
the beat element of 1MHz is output to pin 52.
2. Then set the applied voltage at pin 4 so that the beat
element of 1MHz at pin 52 may be 100dB
μ
.
3. Decrease f2 to the level at which the beat element
becomes 3dB smaller than the element of 1MHz, and
read the value at that level.
1. Input 90dBu SG6.
2. VA is the output level at pin 52. Increase SG6 voltage
until the output at pin 52 becomes 3dB smaller than VA.
The input level at that time is the maximum permissible
input.
Vin max. Maximum permissible input
Vin min. Input sensitivity
1. Decrease SG5 level until the video detector output is 3dB
smaller than the measured value of Parameter V3 "Video
detector output".
μ
AFTN
V1HN
V1LN
AFT detector sensitivity (NEG)
Maximum AFT voltage (NEG)
Minimum AFT voltage (NEG)
See the following figure.
V1HN
V1LN
f
P1
5.0V
3.0V
37.9MHz
39.9MHz
f
0
f
f KHz
(mV/KHz)
1. Adjust the applied voltage at pin 4 so that the lowest
output signal voltage at pin 52 is 2.2V.
IM Intermodulation
2.2V
P52
2. Measure elements of 1.07MHz and 4.43MHz of output at
pin 52.
3. IM is defined as follows:
IM = 20 logElement of 1.07MHz
Element of 4.43MHz
ATT Maximum attenuation
(dB)
(dB)
LIM Input limiting sensitivity
AMR AMR
1. Vam is the element of 400Hz at pin 46.
2. AMR is defined as follows:
AMR = 20 logV
0AFS
(mVrms)
V
am
(mVrms)
AF S/N AF S/N
(dB)
1. Measure the noise (20Hz to 100KHz) of output at pin 46.
2. AF S/N is defined as follows:
V
0AFmax
Measured value
Cn1 Standard chroma output 1 (PAL)
Cn2 Standard chroma output 2 (PAL)
AF S/N = 20 log
(dB)
1. Input VS4P (eb=570mV:level+6dB) to VI IN.
2. Measure the output amplitude at pin 41.
3. ACC1 is defined as follows:
ACC1 = 20 logMeasured value (V
P-P
)
Cn1 (V
P-P
)
(dB)
ACC2 ACC characteristics 2
1. Input VS4P (input level:-20dB) to VI IN.
2. Measure the output amplitude at pin 41.
3. ACC2 is defined as follows:
ACC2 = 20 logMeasured value (V
P-P
)
Cn1 (V
P-P
)
(dB)
ELECTRICAL CHARACTERISTICS TEST METHOD
3dB
1MHz
μ
P52
BW