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參數(shù)資料
| 型號(hào)： | MA838 |
| 廠商： | Zarlink Semiconductor Inc. |
| 英文描述： | SINGLE PHASE PULSE WIDTH MODULATION WAVEFORM GENERATOR |
| 中文描述： | 單相脈寬調(diào)制波形發(fā)生器 |
| 文件頁(yè)數(shù)： | 3/13頁(yè) |
| 文件大?。?/td> | 314K |
| 代理商： | MA838 |
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2
MA838
ABSOLUTE MAXIMUM RATINGS
Supply voltage, V
DD
Voltage on any pin
Current through any I/O pin
Storage temperature (see note)
Operating temperature range (commercial)
Operating temperature range (industrial)
10V
V
SS
-0.3V to V
DD
+0.3V
±10mA
-65°C to +125°C
0°C to +70°C
-40°C to +85°C
NOTE: These temperature ranges apply to all package types.
Many package types are available and extended temperature
ranges can be offered for some packages. Further information
is available on request.
1
6
MA838-2
Pure sinewave:
x(t)
=
A
[
sin
(
t
)]
Additional wave shapes can be implemented to order, provided
they are symmetrical about the 90°, 180° and 270° axes.
Contact your local GEC Plessey Semiconductors Customer
Service Centre for further details.
PRODUCT DESIGNATION
Two standard options exist, defining waveform shape.
These are designated MA838-1 and MA838-2 as follows:
MA838-1
Sine + third harmonic at one sixth the amplitude of the
fundamental:
x(t)
=
A
[
sin
(
t
) +
sin 3( t)
]
DC ELECTRICAL CHARACTERISTICS
Test conditions (unless otherwise stated):
V
DD
= 5V±5%, T
amb
= 25°C
Characteristic
Symbol
Min.
Typ.
Max.
Units
Conditions
Input high voltage
V
IH
2.0
-
-
V
Input low voltage
V
IL
-
-
0.8
V
Input leakage current
I
IN
-
-
10
μA
V
IN
= V
SS
or V
DD
Output high voltage
V
OH
4.0
>4.5
-
V
I
OH
= -4mA
Output low voltage
V
OL
-
<0.2
0.4
V
I
OH
= 4mA
Supply current (static)
(dynamic)
I
DD (static)
I
DD (dynamic)
-
-
-
100
20
μA
mA
all outputs open circuit
CLK = 10MHz
<10
Supply voltage
V
DD
2.7
5.0
5.5
V
AC ELECTRICAL CHARACTERISTICS
Test conditions (unless otherwise stated):
V
DD
= 5V±5%, T
amb
= 25°C
Characteristic
Symbol
Min.
Typ.
Max.
Units
Conditions
Clock frequency
f
CLK
-
-
12.5
MHz
M:S ratio 1:1 ±20%
SET TRIP = 0
→
Outputs tripped
→
TRIP
= 0
t
TRIP
-
-
2/f
CLK
2/f
CLK
3/f
CLK
3/f
CLK
s
s
Stresses above those listed in the Absolute Maximum
Ratings may cause permanent damage to the device. These
are stress ratings only and functional operation of the device at
these conditions, or at any other condition above those indicated
in the operations section of this specification, is not implied.
Exposure to Absolute Maximum Rating conditions for extended
periods may affect device reliability.
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