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      參數(shù)資料
      型號(hào): MAC7111MAG50XX
      廠商: FREESCALE SEMICONDUCTOR INC
      元件分類: 微控制器/微處理器
      英文描述: MICROCONTROLLER, PQFP144
      封裝: 20 X 20 MM, 1.40 MM HEIGHT, 0.50 MM PITCH, ROHS COMPLIANT, LQFP-144
      文件頁(yè)數(shù): 29/56頁(yè)
      文件大小: 757K
      代理商: MAC7111MAG50XX
      ElectricalCharacteristics
      MAC7100 Microcontroller Family Hardware Specifications, Rev. 1.2
      Preliminary
      Freescale Semiconductor
      35
      3.13.8 NVM Reliability
      The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
      monitors and burn-in to screen early life failures. The failure rates for data retention and program/erase
      cycling are specified at the operating conditions noted. The program/erase cycle count on the sector is
      incremented every time a sector or mass erase event is executed.
      NOTE
      All values shown in Table 36 are target values and subject to
      characterization. For Flash cycling performance, each program operation
      must be preceded by an erase.
      Table 36. NVM Reliability Characteristics
      Conditions shown in Table 7 unless otherwise noted.
      Num
      C
      Rating
      Min
      Unit
      X11
      C Program/Data Flash Program/Erase endurance (–40C to +125C)
      10,000
      Cycles
      X12
      C Program/Data Flash Data Retention Lifetime
      15
      Years
      Because
      of
      an
      order
      from
      the
      United
      States
      International
      Trade
      Commission,
      BGA-packaged
      product
      lines
      and
      part
      numbers
      indicated
      here
      currently
      are
      not
      available
      from
      Freescale
      for
      import
      or
      sale
      in
      the
      United
      States
      prior
      to
      September
      2010:MAC7131
      products
      in
      208
      MAPBGA
      packages
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