參數(shù)資料
型號(hào): MAX1258BETM+T
廠商: Maxim Integrated Products
文件頁(yè)數(shù): 31/43頁(yè)
文件大?。?/td> 0K
描述: IC ADC/DAC 12BIT 48-TQFN
產(chǎn)品培訓(xùn)模塊: Lead (SnPb) Finish for COTS
Obsolescence Mitigation Program
標(biāo)準(zhǔn)包裝: 2,500
類型: ADC,DAC
分辨率(位): 12 b
采樣率(每秒): 225k
數(shù)據(jù)接口: 串行
電壓電源: 模擬和數(shù)字
電源電壓: 4.75 V ~ 5.25 V
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 48-WFQFN 裸露焊盤(pán)
供應(yīng)商設(shè)備封裝: 48-TQFN-EP(7x7)
包裝: 帶卷 (TR)
MAX1220/MAX1257/MAX1258
12-Bit, Multichannel ADCs/DACs with FIFO,
Temperature Sensing, and GPIO Ports
______________________________________________________________________________________
37
If reference mode 00 is requested, or if an external ref-
erence is selected but a temperature measurement is
being requested, wait 45s with CS high after writing
the conversion byte to extend the acquisition and allow
the internal reference to power up. To perform a tem-
perature measurement, write 24 bytes (192 cycles) of
zeros after the conversion byte using 8-bit NOP com-
mands each framed by CS (to match production test
method; other length NOP sequences are not produc-
tion tested). The temperature result appears on DOUT
during the last 2 bytes of the 192 cycles. For tempera-
ture conversion in clock mode 11 with the TEMP bit set
in the conversion register, no scanning of AIN0 to
AIN15 is performed. Therefore, the CHSEL[3:0] bits are
don’t cares. These bits can be set to 0000b. When the
conversion is complete, only the temperature data is
available.
Conversion-Time Calculations
The conversion time for each scan is based on a num-
ber of different factors: conversion time per sample,
samples per result, results per scan, if a temperature
measurement is requested, and if the external refer-
ence is in use. Use the following formula to calculate
the total conversion time for an internally timed conver-
sion in clock mode 00 and 10 (see the
Electrical
Characteristics, as applicable):
Total conversion time =
tCONV x nAVG x nSCAN + tTS + tINT-REF,SU
where:
tCONV = tDOV, where tDOV is dependent on the clock
mode and the reference mode selected
nAVG = samples per result (amount of averaging)
nSCAN = number of times each channel is scanned; set
to one unless [SCAN1, SCAN0] = 10
tTS = time required for temperature measurement
(53.1s); set to zero if temperature measurement is not
requested
tINT-REF,SU = tWU (external-reference wake-up); if a
conversion using the external reference is requested
In clock mode 01, the total conversion time depends on
how long CNVST is held low or high. Conversion time in
externally clocked mode (CKSEL1, CKSEL0 = 11)
depends on the SCLK period and how long CS is held
high between each set of eight SCLK cycles. In clock
mode 01, the total conversion time does not include the
time required to turn on the internal reference.
DIN
CONVERSION BYTE #1
CONVERSION #1
CONVERSION #2
ACQUISITION #1
MSB1
LSB1
MSB2
ACQUISITION #2
NOP
CONVERSION BYTE #2
CONVERSION
NOP
EOC
DOUT
SCLK
CS
Figure 9a. Clock Mode 11—Externally Timed Acquisition, Sampling and Conversion without CNVST for Maximum ADC Throughput
DIN
ACQUISITION
CONVERSION
MSB1
LSB1
EOC
DOUT
SCLK
CS
CONVERSION BYTE
NOP
Figure 9b. Clock Mode 11—Externally Timed Acquisition, Sampling and Conversion without CNVST to Reduce Analog Power
Dissipation
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