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參數(shù)資料
| 型號(hào)： | MC100E1651FN |
| 廠商： | Motorola, Inc. |
| 英文描述： | DUAL ECL OUTPUT COMPARATOR WITH LATCH |
| 中文描述： | 雙ECL鎖存輸出比較器 |
| 文件頁(yè)數(shù)： | 4/7頁(yè) |
| 文件大?。?/td> | 133K |
| 代理商： | MC100E1651FN |
MC10E1651
MOTOROLA
ECLinPS and ECLinPS Lite
DL140 — Rev 4
2–4
Figure 3. Input/Output Timing Diagram
Q
Q
VTHR
V
LEN
VBBINT
VOD
tpw
th
ts
tPHL
tPLH(LEN)
VIN
DELAY DISPERSION
Under a constant set of input conditions comparators have
a specified nominal propagation delay. However, since
propagation delay is a function of input slew rate and input
voltage overdrive the delay dispersion parameters, TDE and
TDT, are provided to allow the user to adjust for these
variables (where TDE and TDT apply to inputs with standard
ECL and TTL levels, respectively).
Figure 4 and Figure 5 define a range of input conditions
which incorporate varying input slew rates and input voltage
overdrive. For input parameters that adhere to these
constraints the propagation delay can be described as:
TNOM
±
TDE (or TDT)
where TNOM is the nominal propagation delay. TNOM
accounts for nonuniformity introduced by temperature and
voltage variability, whereas the delay dispersion parameter
takes into consideration input slew rate and input voltage
overdrive variability. Thus a modified propagation delay can
be approximated to account for the effects of input conditions
that differ from those under which the parts where tested. For
example, an application may specify an ECL input with a slew
rate of 0.25 V/NS, an overdrive of 17mV and a temperature of
25
°
C, the delay dispersion parameter would be 100 ps. The
modified propagation delay would be
775ps
±
100ps
Figure 4. ECL Dispersion Test Input Conditions
Figure 5. TTL Dispersion Test Input Conditions
0 V
0.5 V
2.0 V
2.5 V
– 1.75 V
– 1.58 V
– 1.07 V
–0.9 V
SLEW RATE = 0.75 V/NS
SLEW RATE = 0.75 V/NS
SLEW RATE =
0.25 V/NS
SLEW RATE =
0.30 V/NS
INPUT
THRESHOLD
RANGE
INPUT
THRESHOLD
RANGE
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