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參數(shù)資料
| 型號： | MC10168FN |
| 廠商： | ON SEMICONDUCTOR |
| 元件分類： | 鎖存器 |
| 英文描述： | 10K SERIES, HIGH LEVEL TRIGGERED D LATCH, TRUE OUTPUT, PQCC20 |
| 封裝： | PLASTIC, LCC-20 |
| 文件頁數(shù)： | 3/3頁 |
| 文件大小： | 50K |
| 代理商： | MC10168FN |
MC10168
http://onsemi.com
369
ELECTRICAL CHARACTERISTICS (continued)
TEST VOLTAGE VALUES (Volts)
@ Test Temperature
VIHmax
VILmin
VIHAmin
VILAmax
VEE
–30
°C
–0.890
–1.890
–1.205
–1.500
–5.2
+25
°C
–0.810
–1.850
–1.105
–1.475
–5.2
+85
°C
–0.700
–1.825
–1.035
–1.440
–5.2
Pin
Under
TEST VOLTAGE APPLIED TO PINS LISTED BELOW
(VCC)
Characteristic
Symbol
Under
Test
VIHmax
VILmin
VIHAmin
VILAmax
VEE
(VCC)
Gnd
Power Supply Drain Current
IE
8
1, 16
Input Current
IinH
3,7,9,14
4,5,10,12
13
*
13
8
1, 16
IinL
*
8
1, 16
Output Voltage
Logic 1
VOH
2
6
3, 13
7, 13
8
1, 16
Output Voltage
Logic 0
VOL
2
6
3, 5
4, 7
8
1, 16
Threshold Voltage
Logic 1
VOHA
2
6
13
3
7
8
1, 16
Threshold Voltage
Logic 0
VOLA
2
6
13
3
7
8
1, 16
Switching Times
(50
Load)
+1.11V
Pulse In
Pulse Out
–3.2 V
+2.0 V
Propagation Delay
Data
Gate
Clock
t3+2+
t5–2+
t13+2+
2
3
5
13
2
8
1, 16
Setup Time
t3+13+
2
8
1, 16
Hold Time
t13+3+
2
8
1, 16
Rise Time
(20 to 80%)
t2+
2
3
2
8
1, 16
Fall Time
(20 to 80%)
t2–
2
3
2
8
1, 16
* Individually test each input applying VIH or VIL to input under test.
Each MECL 10,000 series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been
established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 linear fpm is maintained.
Outputs are terminated through a 50–ohm resistor to –2.0 volts. Test procedures are shown for only one gate. The other gates are tested in the
same manner.
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