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參數(shù)資料
| 型號： | MC10178P |
| 廠商： | ON SEMICONDUCTOR |
| 元件分類： | 計數(shù)器 |
| 英文描述： | 10K SERIES, ASYN POSITIVE EDGE TRIGGERED 4-BIT UP BINARY COUNTER, PDIP16 |
| 封裝： | PLASTIC, DIP-16 |
| 文件頁數(shù)： | 3/8頁 |
| 文件大小： | 108K |
| 代理商： | MC10178P |
MC10178
http://onsemi.com
3
ELECTRICAL CHARACTERISTICS (continued)
TEST VOLTAGE VALUES (Volts)
@ Test Temperature
VIHmax
VILmin
VIHAmin
VILAmax
VEE
–30
°C
–0.890
–1.890
–1.205
–1.500
–5.2
+25
°C
–0.810
–1.850
–1.105
–1.475
–5.2
+85
°C
–0.700
–1.825
–1.035
–1.440
–5.2
Pin
Under
TEST VOLTAGE APPLIED TO PINS LISTED BELOW
(V
)
Characteristic
Symbol
Under
Test
VIHmax
VILmin
VIHAmin
VILAmax
VEE
(VCC)
Gnd
Power Supply Drain Current
IE
8
9
8
1, 16
Input Current
IinH
12
11
9
12
11
9
8
1, 16
IinL
*
8
1, 16
Output Voltage
Logic 1
VOH
14
15
9
11
8
1, 16
Output Voltage
Logic 0
VOL
14
15
11
9
8
1, 16
Threshold Voltage
Logic 1
VOHA
3
14
15
5
11
9
8
1, 16
Threshold Voltage
Logic 0
VOLA
3
14
15
5
11
9
8
1, 16
Switching Times
(50
Load)
Pulse In
Pulse Out
–3.2 V
+2.0 V
Propagation Delay
Data Input
t12+15+
t12–13–
t12+4–
t12–3+
15
13
4
3
12
15
13
4
3
8
1, 16
Rise Time
(20 to 80%)
t+
15
12
15
8
1, 16
Fall Time
(20 to 80%)
t–
15
12
15
8
1, 16
Set Input
Reset Input
t11–15+
t9–15+
15
11
9
15
8
1, 16
Counting Frequency
fcount
15
12
15
8
1, 16
* Individually test each input applying VIL to input under test.
Each MECL 10,000 series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been
established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 linear fpm is maintained.
Outputs are terminated through a 50–ohm resistor to –2.0 volts. Test procedures are shown for only one gate. The other gates are tested in the
same manner.
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