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參數(shù)資料
| 型號(hào)： | MC10210FN |
| 廠商： | ON SEMICONDUCTOR |
| 元件分類： | 門電路 |
| 英文描述： | 10K SERIES, DUAL 3-INPUT OR GATE, PQCC20 |
| 封裝： | PLASTIC, LCC-20 |
| 文件頁數(shù)： | 3/3頁 |
| 文件大?。?/td> | 47K |
| 代理商： | MC10210FN |
MC10210
http://onsemi.com
422
ELECTRICAL CHARACTERISTICS (continued)
TEST VOLTAGE VALUES (Volts)
@ Test Temperature
VIHmax
VILmin
VIHAmin
VILAmax
VEE
–30
°C
–0.890
–1.890
–1.205
–1.500
–5.2
+25
°C
–0.810
–1.850
–1.105
–1.475
–5.2
+85
°C
–0.700
–1.825
–1.035
–1.440
–5.2
Pin
TEST VOLTAGE APPLIED TO PINS LISTED BELOW
Characteristic
Symbol
Under
Test
VIHmax
VILmin
VIHAmin
VILAmax
VEE
(VCC)
Gnd
Power Supply Drain Current
IE
8
1, 15, 16
Input Current
IinH
5, 6, 7
*
8
1, 15, 16
IinL
5, 6, 7
*
8
1, 15, 16
Output Voltage
Logic 1
VOH
2
3
4
5
6
7
8
1, 15, 16
Output Voltage
Logic 0
VOL
2
3
4
8
1, 15, 16
Threshold Voltage
Logic 1
VOHA
2
3
4
5
6
7
8
1, 15, 16
Threshold Voltage
Logic 0
VOLA
2
3
4
5
6
7
8
1, 15, 16
Switching Times
(50
Load)
Pulse In
Pulse Out
–3.2 V
+2.0 V
Propagation Delay
t5+2+
t5–2–
t5+3+
t5–3–
t5+4+
t5–4–
2
3
4
5
2
3
4
8
1, 15, 16
Rise Time
(20 to 80%)
t2+
t3+
t4+
2
3
4
5
2
3
4
8
1, 15, 16
Fall Time
(20 to 80%)
t2–
t3–
t4–
2
3
4
5
2
3
4
8
1, 15, 16
* Individually test each input using the pin connections shown.
Each MECL 10,000 series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been
established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 linear fpm is maintained.
Outputs are terminated through a 50–ohm resistor to –2.0 volts. Test procedures are shown for only one gate. The other gates are tested in the
same manner.
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