參數(shù)資料
型號(hào): MC74ACT11DT
廠商: ON SEMICONDUCTOR
元件分類: 門電路
英文描述: ACT SERIES, TRIPLE 3-INPUT AND GATE, PDSO14
封裝: PLASTIC, TSSOP-14
文件頁數(shù): 2/8頁
文件大?。?/td> 191K
代理商: MC74ACT11DT
MC74AC11, MC74ACT11
http://onsemi.com
2
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Typ
Max
Unit
VCC
Supply Voltage
′AC
2.0
5.0
6.0
V
′ACT
4.5
5.0
5.5
Vin,Vout
DC Input Voltage, Output Voltage (Ref. to GND)
0
--
VCC
V
tr,tf
Input Rise and Fall Time (Note 1)
′AC Devices except Schmitt Inputs
VCC @3.0 V
--
150
--
VCC @4.5 V
--
40
--
ns/V
VCC @5.5 V
--
25
--
tr,tf
Input Rise and Fall Time (Note 2)
′ACT Devices except Schmitt Inputs
VCC @4.5 V
--
10
--
ns/V
VCC @5.5 V
--
8.0
--
TJ
Junction Temperature (PDIP)
--
140
°C
TA
Operating Ambient Temperature Range
--40
25
85
°C
IOH
Output Current -- High
--
--24
mA
IOL
Output Current -- Low
--
24
mA
1. Vin from 30% to 70% VCC; see individual Data Sheets for devices that differ from the typical input rise and fall times.
2. Vin from 0.8 V to 2.0 V; see individual Data Sheets for devices that differ from the typical input rise and fall times.
DC CHARACTERISTICS
Symbol
Parameter
VCC
(V)
74AC
Unit
Conditions
TA =+25°C
TA =
--40°Cto
+85°C
Typ
Guaranteed Limits
VIH
Minimum High Level
Input Voltage
3.0
1.5
2.1
VOUT =0.1 V
4.5
2.25
3.15
V
or VCC -- 0.1 V
5.5
2.75
3.85
VIL
Maximum Low Level
Input Voltage
3.0
1.5
0.9
VOUT =0.1 V
4.5
2.25
1.35
V
or VCC -- 0.1 V
5.5
2.75
1.65
VOH
Minimum High Level
Output Voltage
3.0
2.99
2.9
IOUT =--50 μA
4.5
4.49
4.4
V
5.5
5.49
5.4
V
*VIN =VIL or VIH
3.0
--
2.56
2.46
--12 mA
4.5
--
3.86
3.76
IOH
--24 mA
5.5
--
4.86
4.76
--24 mA
VOL
Maximum Low Level
Output Voltage
3.0
0.002
0.1
IOUT =50 μA
4.5
0.001
0.1
V
5.5
0.001
0.1
V
*VIN =VIL or VIH
3.0
--
0.36
0.44
12 mA
4.5
--
0.36
0.44
IOL
24 mA
5.5
--
0.36
0.44
24 mA
IIN
Maximum Input
Leakage Current
5.5
--
±0.1
±1.0
μA
VI =VCC,GND
IOLD
Minimum Dynamic
Output Current
5.5
--
75
mA
VOLD =1.65VMax
IOHD
5.5
--
--75
mA
VOHD =3.85VMin
ICC
Maximum Quiescent
Supply Current
5.5
--
4.0
40
μA
VIN =VCC or GND
*All outputs loaded; thresholds on input associated with output under test.
Maximum test duration 2.0 ms, one output loaded at a time.
NOTE: IIN and ICC @ 3.0 V are guaranteed to be less than or equal to the respective limit @ 5.5 V VCC.
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