
Appendix A Electrical Characteristics
MC9S08DV60 Series Data Sheet, Rev 3
Freescale Semiconductor
377
Conversion
Time (Including
sample time)
Short Sample (ADLSMP=0)
D
tADC
—
20
—
ADCK
cycles
See
for conversion
time variances
Long Sample (ADLSMP=1)
—
40
—
Sample Time
Short Sample (ADLSMP=0)
D
tADS
—
3.5
—
ADCK
cycles
Long Sample (ADLSMP=1)
—
23.5
—
Total
Unadjusted
Error
12 bit mode
T
ETUE
—
±3.0
±10
Includes
quantization
10 bit mode
P
—
±1
±2.5
8 bit mode
T
—
±0.5
±1.0
Differential
Non-Linearity
12 bit mode
T
DNL
—
±1.75
±4.0
LSB2
10 bit mode3
P—
±0.5
±1.0
T—
±0.3
±0.5
Integral
Non-Linearity
12 bit mode
T
INL
—
±1.5
±4.0
10 bit mode
T
—
±0.5
±1.0
8 bit mode
T
—
±0.3
±0.5
Zero-Scale
Error
12 bit mode
T
EZS
—
±1.5
±6.0
VADIN = VSSAD
10 bit mode
P
—
±0.5
±1.5
8 bit mode
T
—
±0.5
Full-Scale Error
12 bit mode
T
EFS
—
±1
±4.0
VADIN =VDDAD
10 bit mode
T
—
±0.5
±1
8 bit mode
T
—
±0.5
Quantization
Error
12 bit mode
D
EQ
—
-1 to 0
10 bit mode
—
±0.5
8 bit mode
—
±0.5
Input Leakage
Error
12 bit mode
D
EIL
—
±1
±10.0
Pad leakage4 *
RAS
10 bit mode
—
±0.2
±2.5
8 bit mode
—
±0.1
±1
Temp Sensor
Slope
-40
°C– 25°C
D
m
—
3.266
—
mV/
°C
25
°C– 125°C
—
3.638
—
Temp Sensor
Voltage
25
°CD
VTEMP25
—
1.396
—
V
1 Typical values assume V
DDAD = 5.0V, Temp = 25°C, fADCK=1.0MHz unless otherwise stated. Typical values are for reference
only and are not tested in production.
2 1 LSB = (V
REFH - VREFL)/2
N
Table A-10. 12-bit ADC Characteristics (VREFH = VDDAD, VREFL = VSSAD) (continued)
Characteristic
Conditions
C
Symb
Min
Typ1
Max
Unit
Comment