參數資料
型號: MC9S08LL8CLF
廠商: FREESCALE SEMICONDUCTOR INC
元件分類: 微控制器/微處理器
英文描述: 8-BIT, FLASH, 20 MHz, MICROCONTROLLER, PQFP48
封裝: 7 X 7 MM, 1.40 MM HEIGHT, ROHS COMPLIANT, MS-026BBC, LQFP-48
文件頁數: 3/50頁
文件大?。?/td> 1137K
代理商: MC9S08LL8CLF
Electrical Characteristics
MC9S08LL16 Series MCU Data Sheet, Rev. 4
Freescale Semiconductor
11
where K is a constant pertaining to the particular part. K can be determined from equation 3 by measuring
PD (at equilibrium) for a known TA. Using this value of K, the values of PD and TJ can be obtained by
solving Equation 3-1 and Equation 3-2 iteratively for any value of TA.
3.5
ESD Protection and Latch-Up Immunity
Although damage from electrostatic discharge (ESD) is much less common on these devices than on early
CMOS circuits, normal handling precautions should be taken to avoid exposure to static discharge.
Qualification tests are performed to ensure that these devices can withstand exposure to reasonable levels
of static without suffering any permanent damage.
All ESD testing is in conformity with AEC-Q100 Stress Test Qualification for Automotive Grade
Integrated Circuits. During the device qualification, ESD stresses were performed for the human body
model (HBM), the machine model (MM) and the charge device model (CDM).
A device is defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification. Complete DC parametric and functional testing is performed per the applicable device
specification at room temperature followed by hot temperature, unless instructed otherwise in the device
specification.
Table 6. ESD and Latch-up Test Conditions
Model
Description
Symbol
Value
Unit
Human
Body Model
Series resistance
R1
1500
Ω
Storage capacitance
C
100
pF
Number of pulses per pin
3
Charge
Device
Model
Series resistance
R1
0
Ω
Storage capacitance
C
200
pF
Number of pulses per pin
3
Latch-up
Minimum input voltage limit
–2.5
V
Maximum input voltage limit
7.5
V
Table 7. ESD and Latch-Up Protection Characteristics
No.
Rating1
1 Parameter is achieved by design characterization on a small sample size from typical devices
under typical conditions unless otherwise noted.
Symbol
Min
Max
Unit
1
Human body model (HBM)
VHBM
±2000
V
2
Charge device model (CDM)
VCDM
±500
V
3
Latch-up current at TA = 85°CILAT
±100
mA
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相關代理商/技術參數
參數描述
MC9S08LL8CLF 制造商:Freescale Semiconductor 功能描述:IC 8BIT MCU HCS08 20MHZ LQFP-48
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MC9S08MM128 制造商:FREESCALE 制造商全稱:Freescale Semiconductor, Inc 功能描述:Advanced Information
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