參數(shù)資料
型號(hào): MC9S12B128CFU16
廠商: FREESCALE SEMICONDUCTOR INC
元件分類: 微控制器/微處理器
英文描述: 16-BIT, FLASH, 16 MHz, MICROCONTROLLER, PQFP80
封裝: PLASTIC, QFP-80
文件頁數(shù): 5/132頁
文件大?。?/td> 1842K
代理商: MC9S12B128CFU16
Device User Guide — 9S12B128DGV1/D V01.13
102
Table A-16 NVM Reliability Characteristics1
NOTES:
1. TJavg will not exeed 85°C considering a typical temperature profile over the lifetime of a consumer, industrial or automotive
application.
Conditions are shown in Table A-4 unless otherwise noted
Num C
Rating
Symbol
Min
Typ
Max
Unit
Flash Reliability Characteristics
1C
Data retention after 10,000 program/erase cycles at an
average junction temperature of TJavg 85°C
tFLRET
15
1002
2. Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated
to 25
°C using the Arrhenius equation. For additional information on how Freescale defines Typical Data Retention, please
refer to Engineering Bulletin EB618.
Years
2C
Data retention with <100 program/erase cycles at an
average junction temperature TJavg 85°C
20
1002
3C
Number of program/erase cycles
(–40
°C
T
J 0°C)
nFL
10,000
Cycles
4C
Number of program/erase cycles
(0
°C
T
J 140°C)
10,000
100,0003
3. Spec table quotes typical endurance evaluated at 25
°C for this product family, typical endurance at various temperature
can be estimated using the graph below. For additional information on how Freescale defines Typical Endurance, please
refer to Engineering Bulletin EB619.
EEPROM Reliability Characteristics
5C
Data retention after up to 100,000 program/erase cycles
at an average junction temperature of TJavg 85°C
tEEPRET
15
1002
Years
6C
Data retention with <100 program/erase cycles at an
average junction temperature TJavg 85°C
20
1002
7C
Number of program/erase cycles
(–40
°C
T
J 0°C)
nEEP
10,000
Cycles
8C
Number of program/erase cycles
(0
°C < T
J 140°C)
100,000
300,0003
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