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MCP3302/04
DS21697F-page 6
2011 Microchip Technology Inc.
1.1
Test Circuits
FIGURE 1-2:
Load Circuit for TR, TF, TDO.
FIGURE 1-3:
Load circuit for TDIS and
TEN.
FIGURE 1-4:
Power Supply Sensitivity
Test Circuit (PSRR).
FIGURE 1-5:
Full Differential Test
Configuration Example.
FIGURE 1-6:
Pseudo Differential Test
Configuration Example.
Test Point
1.4V
DOUT
3k
CL = 100 pF
MC
P3
30
X
*Waveform 1 is for an output with internal
conditions such that the output is high, unless
disabled by the output control.
Waveform 2 is for an output with internal
conditions such that the output is low, unless
disabled by the output control.
Test Point
DOUT
3k
100 pF
TDIS Waveform 2
TDIS Waveform 1
TEN Waveform
VDD
VDD/2
VSS
VIH
TDIS
CS
DOUT
Waveform 1*
DOUT
Waveform 2
90%
10%
Voltage Waveforms for TDIS
MC
P3
30X
2.63V
-
+
1k
5V ±500 mVP-P
5VP-P
1k
20 k
To VDD on DUT
1k
1/2
MCP602
VDD = 5V
0.1 F
IN(+)
IN(-)
MCP330X
5VP-P
VREF = 5V
5VP-P
VCM = 2.5V
1F
0.1 F
VREFVDD
VSS
0.1F
IN(+)
IN(-)
MCP330X
VDD = 5V
VCM = 2.5V
5VP-P
VREF = 2.5V
1F
0.1F
VREFVDD
VSS