Sensors
Freescale Semiconductor
3
MC146010
This device contains protection circuitry to guard against
damage due to high static voltages or electric fields.
However, precautions must be taken to avoid applications of
voltages any higher than maximum rated voltages to this
high-impedance circuit. For proper operation, V
IN
and V
OUT
should be constrained to a range of V
SS
≤
(V
IN
or
V
OUT
)
≤
V
DD
except for I/O pin which can exceed V
DD
, and
the Test/Mute input, which can go below V
SS
.
Unused inputs must always be tied to an appropriate logic
voltage level (e.g. either V
SS
or V
DD
). Unused outputs and/or
an unused I/O must be left open.
Table 1. Maximum Ratings
(1)
(Voltages Referenced to V
SS
)
1. Maximum ratings are those values beyond which damage to the device may occur. Functional operation should be restricted to the limits in
the electrical characteristics tables.
2. Derating: -12 mW/°C from 25°C to 60°C.
3. Derating: -3.5 mW/°C from 25°C to 60°C.
Symbol
Parameter
Value
Unit
V
DD
DC Supply Voltage
-0.5 to +12
V
V
IN
DC Input Voltage
C1, C2, Detect
Osc, Low-Supply Trip
I/O
Feedback
Test
-0.25 to V
DD
+0.25
-0.25 to V
DD
+0.25
-0.25 to V
DD
+10
-15 to +25
-1.0 to V
DD
+0.25
±10
V
I
IN
I
OUT
I
DD
DC Input Current, per Pin
mA
DC Output Current, per Pin
±25
mA
DC Supply Current, V
DD
/V
SS
pins
(15 Seconds in Reverse Dir.)
+25 Forward
-150 Reverse
mA
P
D
Power Dissipation
in Stil Air, 5 sec.
Continuous
1200
(2)
350
(3)
mW
T
stg
Storage Temperature
-55 to +125
°C
T
A
Operating Temperature
-25 to +75
°C
T
L
Lead Temperature, 1 mm from case for 10 seconds
260
°C
Table 2. Electrical Characteristics
(Voltages Referenced to V
SS
, T
A
= -10 to 60
°
C unless otherwise indicated.)
Symbol
Parameter
Test Condition
Test
Pin
V
DD
Min
Max
Unit
V
DD
Power Supply Voltage Range
—
—
6.0
12
V
V
TH
Supply Threshold Voltage, Low Supply Alarm
Low Supply Trip: V
IN
= V
DD
/3
15
—
7.2
7.8
V
I
DD
Average Operating Supply Current
(per Package)
(Does not include Current through D3-IR Emitter)
Standby
Configured per
Figure 5
—
—
12
9.0
—
—
9.0
7.0
μA
I
DD
Peak Supply Current (per Package)
(Does not include IRED Current into base of Q1)
During Strobe On, IRED Off
Configured per
Figure 5
During Strobe On, IRED On
Configured per
Figure 5
—
—
12
12
—
—
1.25
2.5
mA
V
IL
Low Level Input Voltage
I/O
Feedback
Test
7.0
10
16
9.0
9.0
9.0
—
—
—
1.5
2.7
0.5
V
V
IM
Mid Level Input Voltage
Test
16
9.0
2.0
V
DD
-2.0
V
V
IH
High Level Input Voltage
I/O
Feedback
Test
7.0
10
16
9.0
9.0
9.0
3.2
6.3
8.5
—
—
—
V
I
IN
Input Current
OSC, Detect
Low-Supply Trip
Feedback
Test
V
IN
= V
SS
or V
DD
V
IN
= V
SS
or V
DD
V
IN
= V
SS
or V
DD
V
IN
= V
SS
or V
DD
3.12
15
10
16
12
12
12
12
-100
-100
-100
-100
+100
+100
+100
+100
nA
I
IL
Test Mode Input Current
V
IN
= V
SS
or V
DD
16
12
-100
-1.0
μ
A