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    參數資料
    型號: MPC8547EVTAQGB
    廠商: FREESCALE SEMICONDUCTOR INC
    元件分類: 微控制器/微處理器
    英文描述: 32-BIT, 1000 MHz, MICROPROCESSOR, PBGA783
    封裝: 29 X 29 MM, 1 MM PITCH, FLIP CHIP, LEAD FREE, PLASTIC, BGA-783
    文件頁數: 31/142頁
    文件大?。?/td> 1504K
    代理商: MPC8547EVTAQGB
    MPC8548E PowerQUICC III Integrated Processor Hardware Specifications, Rev. 5
    126
    Freescale Semiconductor
    Thermal
    20 Thermal
    This section describes the thermal specifications of the MPC8548.
    20.1
    Thermal for Version 2.0 Silicon HiCTE FC-CBGA with Full Lid
    This section describes the thermal specifications for the HiCTE FC-CBGA package for revision 2.0
    silicon.
    Table 80 shows the package thermal characteristics.
    20.2
    Thermal for Version 2.1.1 and 2.1.2 Silicon FC-PBGA with Full Lid
    This section describes the thermal specifications for the FC-PBGA package for revision 2.1.1 silicon.
    Table 81 shows the package thermal characteristics.
    Table 80. Package Thermal Characteristics for HiCTE FC-CBGA
    Characteristic
    JEDEC Board
    Symbol
    Value
    Unit
    Notes
    Die junction-to-ambient (natural convection)
    Single-layer board (1s)
    RθJA
    17
    °C/W
    1, 2
    Die junction-to-ambient (natural convection)
    Four-layer board (2s2p)
    RθJA
    12
    °C/W
    1, 2
    Die junction-to-ambient (200 ft/min)
    Single-layer board (1s)
    RθJA
    11
    °C/W
    1, 2
    Die junction-to-ambient (200 ft/min)
    Four-layer board (2s2p)
    RθJA
    8°C/W
    1, 2
    Die junction-to-board
    N/A
    RθJB
    3°C/W
    3
    Die junction-to-case
    N/A
    RθJC
    0.8
    °C/W
    4
    Notes:
    1. Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board)
    temperature, ambient temperature, airflow, power dissipation of other components on the board, and board thermal
    resistance.
    2. Per JEDEC JESD51-6 with the board (JESD51-7) horizontal.
    3. Thermal resistance between the die and the printed-circuit board per JEDEC JESD51-8. Board temperature is measured on
    the top surface of the board near the package.
    4. Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method
    1012.1). The cold plate temperature is used for the case temperature, measured value includes the thermal resistance of the
    interface layer.
    Table 81. Package Thermal Characteristics for FC-PBGA
    Characteristic
    JEDEC Board
    Symbol
    Value
    Unit
    Notes
    Die junction-to-ambient (natural convection)
    Single-layer board (1s)
    RθJA
    18
    °C/W
    1, 2
    Die junction-to-ambient (natural convection)
    Four-layer board (2s2p)
    RθJA
    13
    °C/W
    1, 2
    Die junction-to-ambient (200 ft/min)
    Single-layer board (1s)
    RθJA
    13
    °C/W
    1, 2
    Die junction-to-ambient (200 ft/min)
    Four-layer board (2s2p)
    RθJA
    9°C/W
    1, 2
    Die junction-to-board
    N/A
    RθJB
    5°C/W
    3
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